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Enhanced Dual-Slope-Based Digitizer for 4-Wire Connected Resistive Sensors
Abstract
This paper introduces a novel dual-slope-based digitizer circuit tailored for 4-wire connected resistive sensors. Utilizing cost-effective components, this circuit offers a simple yet robust method for accurate sensor readings. Experimental tests demonstrate the circuit's capability to measure sensor resistance within the range of 60$\Omega$to 390$\Omega$, corresponding to a temperature span of$-100^{\circ}\mathrm{C}$to$850^{\circ}\mathrm{C}$using an RTD-Pt100 sensor. The circuit exhibits a maximum nonlinearity error of 0.06 % and a maximum measurement error of 0.6$\Omega$, showcasing its high precision. One key advantage of this digitizer is its single measurement cycle requirement, streamlining the measurement process. Additionally, the circuit incorporates constant current excitation to mitigate self-heating effects and minimize its reliance on digital ports, enhancing its speed and reliability in sensor measurements. Moreover, its single-supply operation ensures efficiency, with an average power consumption of approximately 20 mW. These findings underscore the circuit's potential as a cost-effective and efficient solution for a variety of sensing applications.
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References 10 · Cited by 3
Research works printed but not linked: 15
- Barua, 2013, Fundamentals of Industrial Instrumentation
- 2024, Application guide for RTD measurement, Texas Instruments
- 10.1109/JSEN.2006.883903 · DOI
- 10.3390/s23198228 · DOI
- 10.1109/TIM.2023.3291739 · DOI
- 10.1109/TIM.2021.3136176 · DOI
- 10.1088/1361-6501/aca425 · DOI
- 10.1109/ICPCSI.2017.8392163 · DOI
- 10.1109/RTEICT46194.2019.9016933 · DOI
- Elangovan, 2023, Performance Evaluation of Simple Digital Measurement Platform for Remotely - Located RTD Applications, 1
- 10.1109/LSENS.2023.3330115 · DOI
- 2024, Selection Guide for RTD, Omega
- Reissmann, 2024, Application Guide for RTDTENCON
- 2024, Selection Guide for Cables, Texas
- 10.1063/1.4919907 · DOI
Metadata
- Authors
- K, E.
- Affiliations
- School of Electronic Systems and Automation, Digital University Kerala,Thiruvananthapuram,India
- Venue
- 2024 IEEE Region 10 Symposium (TENSYMP)
- Publisher
- IEEE
- Published
- 2024-09-27
- Pages
- 1-4
- OpenAlex
- W4404521184
- Cited by
- 3
- References
- 10
- Citations by year
- 2025: 3
- FWCI
- 2.64
- Type
- conference paper
- Language
- en
- Open access
- closed
- Locations
- IEEE Region 10 Symposium (TENSYMP) (publishedVersion)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Analog and Mixed-Signal Circuit Design
- Physical Sciences › Physics and Astronomy › Instrumentation › Sensor Technology and Measurement Systems
- Physical Sciences › Physics and Astronomy › Instrumentation › Advanced Sensor Technologies Research
- Keywords
- resistance measurement, single-supply operation, low-power analog-to-digital conversion, temperature sensing
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