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Dynamic Characterization of Parallel-Connected High-Power IGBT Modules
Abstract
In high-power converter design, insulated gate bipolar transistor (IGBT) modules are often operated in parallel to reach high output currents. Evaluating the electrical and thermal behavior of the parallel IGBTs is crucial for the design and reliable operation of converter systems. This paper investigates the static and dynamic characterization of parallel IGBTs and the influence of the electrical parameters on the IGBT behavior. Si-based IGBT power modules with voltage rating of 4.5 kV and current rating of 1 kA are used for the experimental evaluation of module parallel connections. Parallel-connected modules have been driven by several commercial IGBT gate units at various dc-link voltages and current levels and with different temperatures. The tested IGBT gate units show good current sharing performance between the two parallel modules. Other important influencing factors such as busbar design layout, stray inductance variation, and gate driving are also investigated for parallel connections of IGBT modules. Finally, the switching energy of the parallel modules is extracted for IGBTs and diodes under different conditions.
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“Furthermore, applications of the medium voltage class, i.e., 3.3 kV, 4.5 kV, and 6.5 kV, for high-power industrial drives, have similar current limitation constraints [7][8][9].”
From Paralleling of IGBT Power Semiconductor Devices and Reliability Issues (2023) · cites this paper as [7]
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Research works printed but not linked: 19
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Cited by
Wu, R., Smirnova, L., Wang, H., Iannuzzo, F., & Blaabjerg, F. (2015) · 2015 9th International Conference on Power Electronics and ECCE Asia (ICPE-ECCE Asia) · doi:10.1109/icpe.2015.7167881 · Cited by 47
Evaluation of Frequency and Temperature Dependence of Power Losses Difference in Parallel IGBTs
Yang, J., Che, Y., Ran, L., & Jiang, H. (2020) · IEEE Access · doi:10.1109/access.2020.2995971 · Cited by 23
Paralleling of IGBT Power Semiconductor Devices and Reliability Issues
Tripathi, R. N., & Omura, I. (2023) · Electronics · doi:10.3390/electronics12183826 · Cited by 14
Metadata
- Authors
- Chen, N., Chimento, F., Nawaz, M., & Wang, L.
- Venue
- IEEE Transactions on Industry Applications
- Published
- 2015-01
- Volume
- 51
- Issue
- 1
- Pages
- 539-546
- ISSN
- 0093-9994
- 1939-9367
- Cited by
- 65
- References
- 0
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