The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.
Application of Centered Differentiation and Steepest Descent to Maximum Power Point Tracking
Abstract
This paper concentrates on two critical aspects to improve the performance of maximum power point tracking (MPPT). One improvement is to accurately locate the position of the maximum power point (MPP) by using the centered differentiation. Another effort is to reduce the oscillation around the MPP in steady state by controlling active perturbations. This paper also adopts the method of steepest descent for MPPT, which shows faster dynamic response and smoother steady state than the method of hill climbing. Comprehensive experimental evaluations have successfully illustrated the effectiveness of the proposed algorithm.
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Cites
Computer Methods for Ordinary Differential Equations and Differential-Algebraic Equations
Ascher, U. M., & Petzold, L. R. (1998) · doi:10.1137/1.9781611971392 · Cited by 2,403 · cited 1×
“The Euler method is simple in use, but shows local truncation errors [21], [22].”
Cited by
Raghavendra, K. V. G., Zeb, K., Muthusamy, A., Krishna, T. N. V., Kumar, S. V. S. V. P., Kim, D.-H., Kim, M.-S., Cho, H.-G., & Kim, H.-J. (2019) · Electronics · doi:10.3390/electronics9010031 · Cited by 269
Metadata
- Authors
- Xiao, W., Dunford, W. G., Palmer, P. R., & Capel, A.
- Venue
- IEEE Transactions on Industrial Electronics
- Published
- 2007-10
- Volume
- 54
- Issue
- 5
- Pages
- 2539-2549
- ISSN
- 0278-0046 (ISSN-L)
- OpenAlex
- W2139327983
- Cited by
- 169
- References
- 1
- FWCI
- 7.55
- Type
- journal article
- Language
- en
- Open access
- closed
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- CoChat. (2026). Citation check: Application of Centered Differentiation and Steepest Descent to Maximum Power Point Tracking. https://app.cochat.ai/papers/10.1109/tie.2007.899922
- The paper
- Xiao, W., Dunford, W. G., Palmer, P. R., & Capel, A. (2007). Application of Centered Differentiation and Steepest Descent to Maximum Power Point Tracking. IEEE Transactions on Industrial Electronics. https://doi.org/10.1109/tie.2007.899922
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