The DOI matches its Crossref record; 31 of the 31 references it cites were found in a registry or an index.
A Polynomial Kernel Induced Distance Metric to Improve Deep Transfer Learning for Fault Diagnosis of Machines
Abstract
Deep transfer-learning-based diagnosis models are promising to apply diagnosis knowledge across related machines, but from which the collected data follow different distribution. To reduce the distribution discrepancy, Gaussian kernel induced maximum mean discrepancy (GK-MMD) is a widely used distance metric to impose constraints on the training of diagnosis models. However, the models using GK-MMD have three weaknesses: 1) GK-MMD may not accurately estimate distribution discrepancy because it ignores the high-order moment distances of data; 2) the time complexity of GK-MMD is high to require much computation cost; 3) the transfer performance of GK-MMD-based diagnosis models is sensitive to the selected kernel parameters. In order to overcome the weaknesses, a distance metric named polynomial kernel induced MMD (PK-MMD) is proposed in this article. Combined with PK-MMD, a diagnosis model is constructed to reuse diagnosis knowledge from one machine to the other. The proposed methods are verified by two transfer learning cases, in which the health states of locomotive bearings are identified with the help of data respectively from motor bearings and gearbox bearings in laboratories. The results show that PK-MMD enables to improve the inefficient computation of GK-MMD, and the PK-MMD-based diagnosis model presents better transfer results than other methods.
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Cites
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Deep learning and its applications to machine health monitoring
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Cited by
Applications of machine learning to machine fault diagnosis: A review and roadmap
Lei, Y., Yang, B., Jiang, X., Jia, F., Li, N., & Nandi, A. K. (2020) · Mechanical Systems and Signal Processing · doi:10.1016/j.ymssp.2019.106587 · Cited by 2,997
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Metadata
- Authors
- Yang, B., Lei, Y., Jia, F., Li, N., & Du, Z.
- Venue
- IEEE Transactions on Industrial Electronics
- Published
- 2020-11
- Volume
- 67
- Issue
- 11
- Pages
- 9747-9757
- ISSN
- 0278-0046 (ISSN-L)
- 1557-9948
- OpenAlex
- W2991521245
- Cited by
- 282
- References
- 31
- FWCI
- 13.46
- Type
- journal article
- Language
- en
- Open access
- closed
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- Yang, B., Lei, Y., Jia, F., Li, N., & Du, Z. (2020). A Polynomial Kernel Induced Distance Metric to Improve Deep Transfer Learning for Fault Diagnosis of Machines. IEEE Transactions on Industrial Electronics. https://doi.org/10.1109/tie.2019.2953010
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