The DOI matches its Crossref record; 132 of the 132 references it cites were found in a registry or an index.
A Survey on Deep Learning for Data-Driven Soft Sensors
Abstract
Soft sensors are widely constructed in process industry to realize process monitoring, quality prediction, and many other important applications. With the development of hardware and software, industrial processes have embraced new characteristics, which lead to the poor performance of traditional soft sensor modeling methods. Deep learning, as a kind of data-driven approach, shows its great potential in many fields, as well as in soft sensing scenarios. After a period of development, especially in the last five years, many new issues have emerged that need to be investigated. Therefore, in this article, the necessity and significance of deep learning for soft sensor applications are demonstrated first by analyzing the merits of deep learning and the trends of industrial processes. Next, mainstream deep learning models, tricks, and frameworks/toolkits are summarized and discussed to help designers propel the developing progress of soft sensors. Then, existing works are reviewed and analyzed to discuss the demands and problems occurred in practical applications. Finally, outlook and conclusions are given.
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Deep Residual Learning for Image Recognition
He, K., Zhang, X., Ren, S., & Sun, J. (2016) · 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2016.90 · Cited by 235,474
ImageNet classification with deep convolutional neural networks
Krizhevsky, A., Sutskever, I., & Hinton, G. E. (2017) · Communications of the ACM · doi:10.1145/3065386 · Cited by 112,155
LeCun, Y., Bengio, Y., & Hinton, G. (2015) · Nature · doi:10.1038/nature14539 · Cited by 84,126
Gradient-based learning applied to document recognition
Lecun, Y., Bottou, L., Bengio, Y., & Haffner, P. (1998) · Proceedings of the IEEE · doi:10.1109/5.726791 · Cited by 58,805
(2014) · Cited by 33,419
(2008) · Journal of Machine Learning Research · Cited by 33,051
Learning representations by back-propagating errors
Rumelhart, D. E., Hinton, G. E., & Williams, R. J. (1986) · Nature · doi:10.1038/323533a0 · Cited by 31,892
PyTorch: An Imperative Style, High-Performance Deep Learning Library
Paszke, A., Gross, S., Massa, F., Lerer, A., Bradbury, J., Chanan, G., Killeen, T., Lin, Z., Gimelshein, N., Antiga, L., et al. (2019) · arXiv · doi:10.48550/arxiv.1912.01703 · Cited by 31,473
Batch Normalization: Accelerating Deep Network Training by Reducing Internal Covariate Shift
Ioffe, S., & Szegedy, C. (2015) · arXiv · doi:10.48550/arxiv.1502.03167 · Cited by 27,818
Learning Phrase Representations using RNN Encoder–Decoder for Statistical Machine Translation
Cho, K., van Merrienboer, B., Gulcehre, C., Bahdanau, D., Bougares, F., Schwenk, H., & Bengio, Y. (2014) · Proceedings of the 2014 Conference on Empirical Methods in Natural Language Processing (EMNLP) · doi:10.3115/v1/d14-1179 · Cited by 25,545
Cited by
Guo, R., Liu, H., & Liu, D. (2024) · IEEE Transactions on Industrial Informatics · doi:10.1109/tii.2023.3297663 · Cited by 79
Rethinking the value of just-in-time learning in the era of industrial big data
Yang, Z., & Ge, Z. (2022) · IEEE Transactions on Industrial Informatics · doi:10.1109/tii.2021.3073645 · Cited by 37
Self-citation
Metadata
- Authors
- Sun, Q., & Ge, Z.
- Venue
- IEEE Transactions on Industrial Informatics
- Published
- 2021-09
- Volume
- 17
- Issue
- 9
- Pages
- 5853-5866
- ISSN
- 1551-3203 (ISSN-L)
- 1941-0050
- OpenAlex
- W3123899295
- Cited by
- 665
- References
- 132
- FWCI
- 42.08
- Type
- journal article
- Language
- en
- Open access
- closed
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