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Complex Wavelet Structural Similarity: A New Image Similarity Index

Sampat, M.P., Zhou Wang, Gupta, S., Bovik, A.C., Markey, M.K.·2009·IEEE Transactions on Image Processing

Abstract

We introduce a new measure of image similarity called the complex wavelet structural similarity (CW-SSIM) index and show its applicability as a general purpose image similarity index. The key idea behind CW-SSIM is that certain image distortions lead to consistent phase changes in the local wavelet coefficients, and that a consistent phase shift of the coefficients does not change the structural content of the image. By conducting four case studies, we have demonstrated the superiority of the CW-SSIM index against other indices (e.g., Dice, Hausdorff distance) commonly used for assessing the similarity of a given pair of images. In addition, we show that the CW-SSIM index has a number of advantages. It is robust to small rotations and translations. It provides useful comparisons even without a preprocessing image registration step, which is essential for other indices. Moreover, it is computationally less expensive.

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Crossref · 10.1109/tip.2009.2025923

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Metadata

Authors
Sampat, M. P., Wang, Z., Gupta, S., Bovik, A. C., & Markey, M. K.
Venue
IEEE Transactions on Image Processing
Published
2009-11
Volume
18
Issue
11
Pages
2385-2401
ISSN
  • 1057-7149 (ISSN-L)
  • 1941-0042
OpenAlex
W2150734399
Cited by
656
References
2
FWCI
22.72
Type
journal article
Language
en
Open access
closed

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

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