The DOI matches its Crossref record; 5 of the 5 references it cites were found in a registry or an index.
BSNet: Bi-Similarity Network for Few-shot Fine-grained Image Classification
Open accessAbstract
Few-shot learning for fine-grained image classification has gained recent attention in computer vision. Among the approaches for few-shot learning, due to the simplicity and effectiveness, metric-based methods are favorably state-of-the-art on many tasks. Most of the metric-based methods assume a single similarity measure and thus obtain a single feature space. However, if samples can simultaneously be well classified via two distinct similarity measures, the samples within a class can distribute more compactly in a smaller feature space, producing more discriminative feature maps. Motivated by this, we propose a so-called Bi-Similarity Network (BSNet) that consists of a single embedding module and a bi-similarity module of two similarity measures. After the support images and the query images pass through the convolution-based embedding module, the bi-similarity module learns feature maps according to two similarity measures of diverse characteristics. In this way, the model is enabled to learn more discriminative and less similarity-biased features from few shots of fine-grained images, such that the model generalization ability can be significantly improved. Through extensive experiments by slightly modifying established metric/similarity based networks, we show that the proposed approach produces a substantial improvement on several fine-grained image benchmark datasets. Codes are available at: https://github.com/PRIS-CV/BSNet.
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LeCun, Y., Bengio, Y., & Hinton, G. (2015) · Nature · doi:10.1038/nature14539 · Cited by 84,126
Grad-CAM: Visual Explanations from Deep Networks via Gradient-Based Localization
Selvaraju, R. R., Cogswell, M., Das, A., Vedantam, R., Parikh, D., & Batra, D. (2017) · 2017 IEEE International Conference on Computer Vision (ICCV) · doi:10.1109/iccv.2017.74 · Cited by 24,513
Model-Agnostic Meta-Learning for Fast Adaptation of Deep Networks
Finn, C., Abbeel, P., & Levine, S. (2017) · arXiv · doi:10.48550/arxiv.1703.03400 · Cited by 8,512
Recent advances in convolutional neural networks
Gu, J., Wang, Z., Kuen, J., Ma, L., Shahroudy, A., Shuai, B., Liu, T., Wang, X., Wang, G., Cai, J., et al. (2018) · Pattern Recognition · doi:10.1016/j.patcog.2017.10.013 · Cited by 6,576
Low-Shot Learning with Imprinted Weights
Qi, H., Brown, M., & Lowe, D. G. (2018) · 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition · doi:10.1109/cvpr.2018.00610 · Cited by 539
Cited by
A Comprehensive Survey of Few-shot Learning: Evolution, Applications, Challenges, and Opportunities
Song, Y., Wang, T., Cai, P., Mondal, S. K., & Sahoo, J. P. (2023) · ACM Computing Surveys · doi:10.1145/3582688 · Cited by 721
Deep metric learning for few-shot image classification: A Review of recent developments
Li, X., Yang, X., Ma, Z., & Xue, J.-H. (2023) · Pattern Recognition · doi:10.1016/j.patcog.2023.109381 · Cited by 243
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Metadata
- Authors
- Li, X., Wu, J., Sun, Z., Ma, Z., Cao, J., & Xue, J.-H.
- Venue
- IEEE Transactions on Image Processing
- Published
- 2021
- Volume
- 30
- Pages
- 1318-1331
- ISSN
- 1057-7149 (ISSN-L)
- 1941-0042
- OpenAlex
- W3107763055
- Cited by
- 214
- References
- 5
- FWCI
- 7.96
- Type
- journal article
- Language
- en
- Open access
- green
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