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Cited by 437

The DOI matches its Crossref record; 14 of the 14 references it cites were found in a registry or an index.

On Detecting Edges

Nalwa, Vishvjit S., Binford, Thomas O.·1986·IEEE Transactions on Pattern Analysis and Machine Intelligence

Abstract

An edge in an image corresponds to a discontinuity in the intensity surface of the underlying scene. It can be approximated by a piecewise straight curve composed of edgels, i.e., short, linear edgeelements, each characterized by a direction and a position. The approach to edgel-detection here, is to fit a series of one-dimensional surfaces to each window (kernel of the operator) and accept the surfacedescription which is adequate in the least squares sense and has the fewest parameters. (A one-dimensional surface is one which is constant along some direction.) The tanh is an adequate basis for the step-edge and its combinations are adequate for the roof-edge and the line-edge. The proposed method of step-edgel detection is robust with respect to noise; for (step-size/noise) > 2.5, it has subpixel position localization (position < 3) and an angular localization better than 100; further, it is designed to be insensitive to smooth shading. These results are demonstrated by some simple analysis, statistical data, and edgel-images. Also included is a comparison of performance on a real image, with a typical operator (Difference-of-Gaussians). The results indicate that the proposed operator is superior with respect to detection, localization, and resolution.

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Metadata

Authors
Nalwa, V. S., & Binford, T. O.
Venue
IEEE Transactions on Pattern Analysis and Machine Intelligence
Published
1986-11
Volume
PAMI-8
Issue
6
Pages
699-714
ISSN
  • 0162-8828 (ISSN-L)
  • 2160-9292
OpenAlex
W2078085827
Cited by
437
References
14
FWCI
18.95
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: On Detecting Edges. https://app.cochat.ai/papers/10.1109/tpami.1986.4767852
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Nalwa, V. S., & Binford, T. O. (1986). On Detecting Edges. IEEE Transactions on Pattern Analysis and Machine Intelligence. https://doi.org/10.1109/tpami.1986.4767852

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