The DOI matches its Crossref record; 77 of the 80 references it cites were found in a registry or an index.
Defect-GAN: High-Fidelity Defect Synthesis for Automated Defect Inspection
Open accessAbstract
Automated defect inspection is critical for effective and efficient maintenance, repair, and operations in advanced manufacturing. On the other hand, automated defect inspection is often constrained by the lack of defect samples, especially when we adopt deep neural networks for this task. This paper presents Defect-GAN, an automated defect synthesis network that generates realistic and diverse defect samples for training accurate and robust defect inspection networks. Defect-GAN learns through defacement and restoration processes, where the defacement generates defects on normal surface images while the restoration removes defects to generate normal images. It employs a novel compositional layer-based architecture for generating realistic defects within various image backgrounds with different textures and appearances. It can also mimic the stochastic variations of defects and offer flexible control over the locations and categories of the generated defects within the image background. Extensive experiments show that Defect-GAN is capable of synthesizing various defects with superior diversity and fidelity. In addition, the synthesized defect samples demonstrate their effectiveness in training better defect inspection networks.
Overview
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
In the citing paper
“Fully supervised learning methods [6,7], used in deep learning, depend on datasets meticulously labeled by experts for model training. Although effective, this approach poses a significant financial burden on many facilities due to the high labor costs involved.”
From An Unsupervised Method for Industrial Image Anomaly Detection with Vision Transformer-Based Autoencoder (2024) · cites this paper as [6]
Citations
Cites
Deep Residual Learning for Image Recognition
He, K., Zhang, X., Ren, S., & Sun, J. (2016) · 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2016.90 · Cited by 235,474
Adam: A Method for Stochastic Optimization
Kingma, D. P., & Ba, J. (2014) · arXiv · doi:10.48550/arxiv.1412.6980 · Cited by 98,946
Faster R-CNN: Towards Real-Time Object Detection with Region Proposal Networks
Ren, S., He, K., Girshick, R., & Sun, J. (2017) · IEEE Transactions on Pattern Analysis and Machine Intelligence · doi:10.1109/tpami.2016.2577031 · Cited by 73,472
Faster R-CNN: Towards Real-Time Object Detection with Region Proposal Networks
Ren, S., He, K., Girshick, R., & Sun, J. (2015) · arXiv · doi:10.48550/arxiv.1506.01497 · Cited by 70,812
Densely Connected Convolutional Networks
Huang, G., Liu, Z., Van Der Maaten, L., & Weinberger, K. Q. (2017) · 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2017.243 · Cited by 48,566
Unpaired image-to-image translation using cycle-consistent adversarial networks
Zhu, J.-Y., Park, T., Isola, P., & Efros, A. A. (2017) · 2017 IEEE International Conference on Computer Vision (ICCV) · doi:10.1109/iccv.2017.244 · Cited by 23,602
Image-to-Image Translation with Conditional Adversarial Networks
Isola, P., Zhu, J.-Y., Zhou, T., & Efros, A. A. (2017) · 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2017.632 · Cited by 22,930
Labaca-Castro, R. (2023) · Springer eBooks · doi:10.1007/978-3-658-40442-0_9 · Cited by 21,119
GAN(Generative Adversarial Nets)
淳司, 柴. (2017) · Journal of Japan Society for Fuzzy Theory and Intelligent Informatics · doi:10.3156/jsoft.29.5_177_2 · Cited by 20,507
Photo-Realistic Single Image Super-Resolution Using a Generative Adversarial Network
Ledig, C., Theis, L., Huszar, F., Caballero, J., Cunningham, A., Acosta, A., Aitken, A., Tejani, A., Totz, J., Wang, Z., et al. (2017) · 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2017.19 · Cited by 12,696
Research works printed but not linked: 4
- yang, 2017, Deep concrete inspection using unmanned aerial vehicle towards CSSC database, IEEE/RSJ International Conference on Intelligent Robots and Systems
- 10.1109/CVPR.2017.632 · DOI · Paper page
- 10.1109/CVPR.2018.00131 · DOI
- 10.1109/ICCV.2019.00460 · DOI
Cited by
Sorted by citations
Deep Industrial Image Anomaly Detection: A Survey
Liu, J., Xie, G., Wang, J., Li, S., Wang, C., Zheng, F., & Jin, Y. (2024) · Machine Intelligence Research · doi:10.1007/s11633-023-1459-z · Cited by 463
“DefectGAN [164] also believes that defects and normal backgrounds can be layered, and that defects are foreground.”
AnomalyDiffusion: Few-Shot Anomaly Image Generation with Diffusion Model
Hu, T., Zhang, J., Yi, R., Du, Y., Chen, X., Liu, L., Wang, Y., & Wang, C. (2024) · Proceedings of the AAAI Conference on Artificial Intelligence · doi:10.1609/aaai.v38i8.28696 · Cited by 192
Diverse Image Inpainting with Bidirectional and Autoregressive Transformers
Yu, Y., Zhan, F., Wu, R., Pan, J., Cui, K., Lu, S., Ma, F., Xie, X., & Miao, C. (2021) · ACM International Conference on Multimedia (ACM MM) · doi:10.1145/3474085.3475436 · Cited by 166
Self-citationFew-Shot Defect Image Generation via Defect-Aware Feature Manipulation
Duan, Y., Hong, Y., Niu, L., & Zhang, L. (2023) · Proceedings of the AAAI Conference on Artificial Intelligence · doi:10.1609/aaai.v37i1.25132 · Cited by 121
Region- and Strength-Controllable GAN for Defect Generation and Segmentation in Industrial Images
Niu, S., Li, B., Wang, X., & Peng, Y. (2021) · IEEE Transactions on Industrial Informatics · doi:10.1109/tii.2021.3127188 · Cited by 104
Yang, G., Liu, K., Zhang, J., Zhao, B., Zhao, Z., Chen, X., & Chen, B. M. (2022) · Construction and Building Materials · doi:10.1016/j.conbuildmat.2022.129226 · Cited by 99
A New Contrastive GAN With Data Augmentation for Surface Defect Recognition Under Limited Data
Du, Z., Gao, L., & Li, X. (2022) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2022.3232649 · Cited by 65
DLS -GAN: Generative Adversarial Nets for Defect Location Sensitive Data Augmentation
Li, W., Gu, C., Chen, J., Ma, C., Zhang, X., Chen, B., & Wan, S. (2023) · IEEE Transactions on Automation Science and Engineering · doi:10.1109/tase.2023.3309629 · Cited by 60
Mask2Defect: A Prior Knowledge-Based Data Augmentation Method for Metal Surface Defect Inspection
Yang, B., Liu, Z., Duan, G., & Tan, J. (2021) · IEEE Transactions on Industrial Informatics · doi:10.1109/tii.2021.3126098 · Cited by 61
Liu, K., & Chen, B. M. (2022) · IEEE Transactions on Industrial Electronics · doi:10.1109/tie.2022.3204953 · Cited by 61
Unbalanced Feature Transport for Exemplar-based Image Translation
Zhan, F., Yu, Y., Cui, K., Zhang, G., Lu, S., Pan, J., Zhang, C., Ma, F., Xie, X., & Miao, C. (2021) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr46437.2021.01478 · Cited by 61
Self-citationA Survey of Defect Detection Applications Based on Generative Adversarial Networks
He, X., Chang, Z., Zhang, L., Xu, H., Chen, H., & Luo, Z. (2022) · IEEE Access · doi:10.1109/access.2022.3217227 · Cited by 57
DiffDD: A surface defect detection framework with diffusion probabilistic model
Zhou, X., Zhang, Y., Ren, Z., Mi, T., Feng, K., Zhou, S., & Jiang, Z. (2024) · Advanced Engineering Informatics · doi:10.1016/j.aei.2024.102637 · Cited by 50
DG-GAN: A High Quality Defect Image Generation Method for Defect Detection
He, X., Luo, Z., Li, Q., Chen, H., & Li, F. (2023) · Sensors · doi:10.3390/s23135922 · Cited by 44
Computer vision defect detection on unseen backgrounds for manufacturing inspection
Mezher, A. M., & Marble, A. E. (2023) · Expert Systems with Applications · doi:10.1016/j.eswa.2023.122749 · Cited by 49
Survey on industrial defect detection with deep learning
罗, 东., 蔡, 雨., 杨, 子., 章, 哲., 周, 瑜., & 白, 翔. (2022) · Scientia Sinica Informationis · doi:10.1360/ssi-2021-0336 · Cited by 44
Wang, Y., Hu, W., Wen, L., & Gao, L. (2023) · IEEE Transactions on Industrial Informatics · doi:10.1109/tii.2023.3252410 · Cited by 40
An Overview of Image Generation of Industrial Surface Defects
Zhong, X., Zhu, J., Liu, W., Hu, C., Deng, Y., & Wu, Z. (2023) · Sensors · doi:10.3390/s23198160 · Cited by 44
Tao, H. (2023) · Mechanical Systems and Signal Processing · doi:10.1016/j.ymssp.2023.111082 · Cited by 39
Diversifying Tire-Defect Image Generation Based on Generative Adversarial Network
Zhang, Y., Wang, Y., Jiang, Z., Liao, F., Li, Z., Tan, D., Chen, J., & Lu, J. (2022) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2022.3160542 · Cited by 39
Towards Continual Adaptation in Industrial Anomaly Detection
Li, W., Zhan, J., Wang, J., Xia, B., Gao, B.-B., Liu, J., Wang, C., & Zheng, F. (2022) · ACM International Conference on Multimedia (ACM MM) · doi:10.1145/3503161.3548232 · Cited by 40
Defect Image Sample Generation With Diffusion Prior for Steel Surface Defect Recognition
Tai, Y., Yang, K., Peng, T., Huang, Z., & Zhang, Z. (2024) · IEEE Transactions on Automation Science and Engineering · doi:10.1109/tase.2024.3482362 · Cited by 39
A survey on RGB, 3D, and multimodal approaches for unsupervised industrial image anomaly detection
Lin, Y., Chang, Y., Tong, X., Yu, J., Liotta, A., Huang, G., Song, W., Zeng, D., Wu, Z., Wang, Y., et al. (2025) · Information Fusion · doi:10.1016/j.inffus.2025.103139 · Cited by 61
PNPDet: Efficient Few-shot Detection without Forgetting via Plug-and-Play Sub-networks
Zhang, G., Cui, K., Wu, R., Lu, S., & Tian, Y. (2021) · IEEE Winter Conference on Applications of Computer Vision · doi:10.1109/wacv48630.2021.00387 · Cited by 39
Self-citationYang, Q., & Guo, R. (2024) · Sensors · doi:10.3390/s24082440 · Cited by 35
“Fully supervised learning methods [6,7], used in deep learning, depend on datasets meticulously labeled by experts for model training.”
MethodA Novel Remote Visual Inspection System for Bridge Predictive Maintenance
Galdelli, A., D’Imperio, M., Marchello, G., Mancini, A., Scaccia, M., Sasso, M., Frontoni, E., & Cannella, F. (2022) · Remote Sensing · doi:10.3390/rs14092248 · Cited by 37
DG2GAN: improving defect recognition performance with generated defect image sample
Deng, F., Luo, J., Fu, L., Huang, Y., Chen, J., Li, N., Zhong, J., & Lam, T. L. (2024) · Scientific Reports · doi:10.1038/s41598-024-64716-y · Cited by 34
Dual-Interrelated Diffusion Model for Few-Shot Anomaly Image Generation
Jin, Y., Peng, J., He, Q., Hu, T., Wu, J., Chen, H., Wang, H., Zhu, W., Chi, M., Liu, J., et al. (2025) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr52734.2025.02832 · Cited by 37
GenCo: Generative Co-training for Generative Adversarial Networks with Limited Data
Cui, K., Huang, J., Luo, Z., Zhang, G., Zhan, F., & Lu, S. (2022) · Proceedings of the AAAI Conference on Artificial Intelligence · doi:10.1609/aaai.v36i1.19928 · Cited by 33
Self-citationPeres, R. S., Guedes, M., Miranda, F., & Barata, J. (2021) · IEEE Access · doi:10.1109/access.2021.3082690 · Cited by 32
Synthetic data in generalizable, learning-based neuroimaging
Gopinath, K. K., Hoopes, A., Alexander, D. C., Arnold, S. E., Balbastre, Y., Billot, B., Casamitjana, A., Cheng, Y., Chua, R. Y. Z., Edlow, B. L., et al. (2024) · Imaging Neuroscience · doi:10.1162/imag_a_00337 · Cited by 34
Towards a Comprehensive Visual Quality Inspection for Industry 4.0*
Rožanec, J. M., Zajec, P., Trajkova, E., Šircelj, B., Brecelj, B., Novalija, I., Dam, P., Fortuna, B., & Mladenić, D. (2022) · IFAC-PapersOnLine · doi:10.1016/j.ifacol.2022.09.486 · Cited by 30
TF²: Few-Shot Text-Free Training-Free Defect Image Generation for Industrial Anomaly Inspection
Yu, Q., Zhu, K., Cao, Y. H., Xia, F., & Kang, Y. (2024) · IEEE Transactions on Circuits and Systems for Video Technology · doi:10.1109/tcsvt.2024.3424435 · Cited by 26
Unseen Visual Anomaly Generation
Sun, H., Cao, Y., Dong, H., & Fink, O. (2025) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr52734.2025.02375 · Cited by 23
Synthetic Data for Defect Segmentation on Complex Metal Surfaces
Fulir, J., Bosnar, L., Hagen, H., & Gospodnetić, P. (2023) · IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) · doi:10.1109/cvprw59228.2023.00465 · Cited by 22
Intraclass Image Augmentation for Defect Detection Using Generative Adversarial Neural Networks
Sampath, V., Maurtua, I., Martín, J. J. A., Iriondo, A., Lluvia, I., & Aizpurua, G. (2023) · Sensors · doi:10.3390/s23041861 · Cited by 21
Wei, J., Shen, F., Lv, C., Zhang, Z., Zhang, F., & Yang, H. (2023) · IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) · doi:10.1109/cvprw59228.2023.00467 · Cited by 21
Mask-Guided Generation Method for Industrial Defect Images with Non-uniform Structures
Wei, J., Zhang, Z., Shen, F., & Lv, C. (2022) · Machines · doi:10.3390/machines10121239 · Cited by 20
Gong, Y., Liu, M., & Wang, X. (2023) · Advanced Engineering Informatics · doi:10.1016/j.aei.2023.102253 · Cited by 19
Ye, S., Wang, Z., Xiong, P., Xu, X., Du, L., Tan, J., & Wang, W. (2023) · Journal of Intelligent Manufacturing · doi:10.1007/s10845-023-02168-3 · Cited by 17
Long-Tailed Anomaly Detection with Learnable Class Names
Ho, C.-H., Peng, K., & Vasconcelos, N. M. (2024) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr52733.2024.01182 · Cited by 21
Defect Spectrum: A Granular Look of Large-Scale Defect Datasets with Rich Semantics
Yang, S., Chen, Z., Chen, P., Fang, X., Liang, Y., Liu, S., & Chen, Y.-C. (2024) · Lecture notes in computer science · doi:10.1007/978-3-031-72667-5_11 · Cited by 21
DefectFill: Realistic Defect Generation with Inpainting Diffusion Model for Visual Inspection
Song, J., Park, D., Baek, K., Lee, S., Choi, J., Kim, E., & Yoon, S. (2025) · IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings · doi:10.1109/cvpr52734.2025.01744 · Cited by 18
Singh, A. R., Hazra, S., Goswami, A., Debattista, K., & Bashford‐Rogers, T. (2025) · Computers in Industry · doi:10.1016/j.compind.2025.104360 · Cited by 17
Wu, T.-Y., Wu, R., Wang, P., Lin, T., & Chang, K. (2023) · Engineering Structures · doi:10.1016/j.engstruct.2023.116130 · Cited by 15
Advancing Ultrasonic Defect Detection in High-Speed Wheels via UT-YOLO
Zhang, Q., Peng, J.-P., Tian, K., Wang, A., Li, J.-L., & Gao, X.-R. (2024) · Italian National Conference on Sensors · doi:10.3390/s24051555 · Cited by 18
Gong, Y., Wang, X., Zhou, C.-C., Ge, M., Liu, C., & Zhang, X. (2024) · Journal of Intelligent Manufacturing · doi:10.1007/s10845-023-02270-6 · Cited by 16
DefectGAN: Synthetic Data Generation for EMU Defects Detection With Limited Data
Liu, S., Ni, H., Li, C., Zou, Y., & Luo, Y. (2024) · IEEE Sensors Journal · doi:10.1109/jsen.2024.3386711 · Cited by 17
ul-Huda, N., Ahmad, H., Banjar, A., Alzahrani, A. O., Ahmad, I., & Naeem, M. S. (2024) · Heliyon · doi:10.1016/j.heliyon.2024.e26466 · Cited by 14
Truong, A. M., & Luong, H. Q. (2024) · Current Research in Food Science · doi:10.1016/j.crfs.2024.100758 · Cited by 14
Few-Shot Defect Image Generation Based on Consistency Modeling
Shi, Q., Wei, J., Shen, F., & Zhang, Z. (2024) · Lecture notes in computer science · doi:10.1007/978-3-031-73116-7_21 · Cited by 17
Robust unsupervised-learning based crack detection for stamped metal products
Zhang, P., Ryu, H., Miao, Y., Jo, S., & Park, G. (2024) · Journal of Manufacturing Systems · doi:10.1016/j.jmsy.2024.01.003 · Cited by 12
A mask guided cross data augmentation method for industrial defect detection
Wang, X., Li, W., & Lu, C. H. (2024) · Future Generation Computer Systems · doi:10.1016/j.future.2024.107676 · Cited by 12
Alam, L., & Kehtarnavaz, N. (2023) · Sensors · doi:10.3390/s23104864 · Cited by 11
Intelligent IoT framework with GAN‐synthesized images for enhanced defect detection in manufacturing
Aramkul, S., & Sugunnasil, P. (2023) · Computational Intelligence · doi:10.1111/coin.12619 · Cited by 11
Synthesizing Industrial Defect Images Under Data Imbalance
Eun-Hee, C., Jeon, B., & Park, I. K. (2023) · IEEE Access · doi:10.1109/access.2023.3322927 · Cited by 10
On-the-fly image-level oversampling for imbalanced datasets of manufacturing defects
Theodoropoulos, S., Zajec, P., Rožanec, J. M., Kyriazis, D., & Tsanakas, P. D. (2024) · Machine Learning · doi:10.1007/s10994-023-06498-4 · Cited by 11
Ferdousi, R., Yang, C., Hossain, M. A., Laamarti, F., Hossain, M. S., & Saddik, A. E. (2024) · Cognitive Computation · doi:10.1007/s12559-024-10283-3 · Cited by 10
Industrial and medical anomaly detection through cycle-consistent adversarial networks
Bougaham, A., Delchevalerie, V., Adoui, M. E., & Frénay, B. (2024) · Neurocomputing · doi:10.1016/j.neucom.2024.128762 · Cited by 10
FEGAN: A Feature Extraction Based Approach for GAN Anomaly Detection and Localization
Fan, F., Zhang, L., & Dai, Y. (2024) · IEEE Access · doi:10.1109/access.2024.3406438 · Cited by 11
Shancheng, T., Jin, Z., Zhang, Y., Lu, J., Li, H., & Jiqing, Y. (2023) · Processes · doi:10.3390/pr11092615 · Cited by 11
Liu, B., Ding, L., He, L., Yang, L., Zhang, X., & Tian, Y. (2025) · Engineering Applications of Artificial Intelligence · doi:10.1016/j.engappai.2025.112720 · Cited by 9
Training-Free Industrial Defect Generation with Diffusion Models
Xu, R., Chiu, Y.-T., Chen, T.-I., Chew, O., Chuang, Y., & Cheng, W.-H. (2025) · IEEE/CVF International Conference on Computer Vision (ICCV) · doi:10.1109/iccv51701.2025.02244 · Cited by 9
Liu, K., Yang, G., Zhang, J., Zhao, Z., Chen, X., & Chen, B. M. (2022) · International Conference on Control and Automation · doi:10.1109/icca54724.2022.9831925 · Cited by 9
Defect Synthesis Using Latent Mapping Adversarial Network for Automated Visual Inspection
Song, S., Chang, K., Yun, K., Jun, C., & Baek, J. (2022) · Electronics · doi:10.3390/electronics11172763 · Cited by 9
Defect image generation through feature disentanglement using StyleGAN2-ADA
He, Z., Wu, K., & Wen, Y. (2025) · Neurocomputing · doi:10.1016/j.neucom.2025.130455 · Cited by 11
A Comprehensive Library for Benchmarking Multi-Class Visual Anomaly Detection
Zhang, J., He, H., 甘振业, He, Q., Cai, Y., Xue, Z., Wang, Y., Wang, C., Xie, L., & Liu, Y. (2025) · IEEE International Conference on Computer Vision Workshops · doi:10.1109/iccvw69036.2025.00373 · Cited by 32
Jiang, Z., Dou, X., Liu, X., Xue, C., Wang, A., & Zhang, G. (2024) · Sensors · doi:10.3390/s24175636 · Cited by 8
Self-citationA survey of generative models for image-based structural health monitoring in civil infrastructure
Gwon, G.-H., & Jung, H. (2025) · Journal of Infrastructure Intelligence and Resilience · doi:10.1016/j.iintel.2025.100138 · Cited by 9
Image Defect Recognition Method Based on Deep Learning Network
Di, X., & Li, L. (2022) · Mobile Information Systems · doi:10.1155/2022/5696334 · Cited by 8
RetractedAnomalyControl: Few-Shot Anomaly Generation by ControlNet Inpainting
Ali, M., Fioraio, N., Salti, S., & Stefano, L. D. (2024) · IEEE Access · doi:10.1109/access.2024.3520002 · Cited by 8
YOLOv8-SC: improving the YOLOv8 network for real-time detection of automotive coated surface defects
Ling, L., Zhu, C., Liu, M., Hu, J., Zhang, X., & Ge, M. (2025) · Measurement Science and Technology · doi:10.1088/1361-6501/adb05b · Cited by 7
Improving the Fairness of the Min-Max Game in GANs Training
Zhang, Z., Yang, H., Wang, H., & McLoone, S. (2024) · IEEE Winter Conference on Applications of Computer Vision · doi:10.1109/wacv57701.2024.00289 · Cited by 7
Towards Accurate Unified Anomaly Segmentation
Ma, W., Yao, Q., Zhang, X., Huang, Z., Jiang, Z., & Zhou, S. (2025) · IEEE Winter Conference on Applications of Computer Vision · doi:10.1109/wacv61041.2025.00138 · Cited by 10
Anomaly detection for surface of laptop computer based on PatchCore GAN algorithm
Zhu, H., Kang, Y., Zhao, Y., Yan, X., & Zhang, J. (2022) · Chinese Control Conference (CCC) · doi:10.23919/ccc55666.2022.9902712 · Cited by 7
Weakly Supervised Complex Texture Defect Detection Based on Nested U-Net Architecture
Huang, K., Zeng, Y., Zhao, J., Chai, S., & Yang, F. (2025) · Journal of Nondestructive Evaluation · doi:10.1007/s10921-025-01161-5 · Cited by 6
Liang, X., & Wang, H. (2025) · IEEE Transactions on Consumer Electronics · doi:10.1109/tce.2025.3563272 · Cited by 6
Generative Models Training Based on FEM Simulations Toward Improved Defect Detection
Tzelepakis, A., Dimitriou, N., Charalampous, P., Tsongas, K., Tzetzis, D., & Tzovaras, D. K. (2025) · IEEE Transactions on Instrumentation and Measurement · doi:10.1109/tim.2025.3568966 · Cited by 6
Multi-Flow: Multi-View-Enriched Normalizing Flows for Industrial Anomaly Detection
Kruse, M., & Rosenhahn, B. (2025) · IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) · doi:10.1109/cvprw67362.2025.00378 · Cited by 12
Ku, D., & Pahk, H.-J. (2024) · IEEE Access · doi:10.1109/access.2024.3380618 · Cited by 6
Advancing Architectural Design Through Generative Adversarial Network Deep Learning Technology
Huang, Y., & He, J. (2024) · International Journal of Distributed Systems and Technologies · doi:10.4018/ijdst.353305 · Cited by 6
Increasing the Generalization of Supervised Fabric Anomaly Detection Methods to Unseen Fabrics
Rippel, O., Zwinge, C., & Merhof, D. (2022) · Sensors · doi:10.3390/s22134750 · Cited by 6
Robust AD: A Real World Benchmark Dataset for Robustness in Industrial Anomaly Detection
Pemula, L., Zhang, D., & Dabeer, O. (2025) · IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) · doi:10.1109/cvprw67362.2025.00389 · Cited by 5
Xie, X., Li, C., Qing, R., Zhou, C., & Zhang, Z. (2024) · Digital Signal Processing · doi:10.1016/j.dsp.2024.104441 · Cited by 5
Utilizing generative AI for crack detection in the marble industry
Vrochidou, Ε., Sidiropoulos, G. K., Ouzounis, A. G., Tsimperidis, I., Kalpakis, V., Stamkos, A., & Papakostas, G. A. (2025) · Engineering Research Express · doi:10.1088/2631-8695/adaca7 · Cited by 6
Automatic Inspection of Seal Integrity in Sterile Barrier Packaging: A Deep Learning Approach
Diaz, J. Z., Farooq, M. A., & Corcoran, P. (2024) · IEEE Access · doi:10.1109/access.2023.3348779 · Cited by 5
Detection of Stain Defects in Textile Industry using State-of-Art Transfer Learning Models
Karegowda, A. G., Pooja, R., Rani, A. L., & Devika, G. (2024) · International Conference on Smart Systems for Applications in Electrical Sciences (ICSSES) · doi:10.1109/icsses62373.2024.10561384 · Cited by 5
Unbalanced Feature Transport for Exemplar-based Image TranslationPreprint
Zhan, F. (2021) · doi:10.31219/osf.io/f6vur · Cited by 5
Component-Aware Unsupervised Logical Anomaly Generation for Industrial Anomaly Detection
Tong, X., Chang, Y., Zhao, Q., Yu, J., Wang, B., Lin, J., Lin, Y., Mai, X., Wang, H., Tao, Z., et al. (2025) · Proceedings - IEEE International Conference on Robotics and Automation/Proceedings · doi:10.1109/icra55743.2025.11127296 · Cited by 7
DefectGen: Few-Shot Defect Image Generation using Stable Diffusion for Steel Surface Analysis
Tayeb, A. M., Nakayiza, H. L., Shin, H., Lee, S., Lee, C., Lee, Y. S., Kim, D., & Lee, J. M. (2024) · International Conference on Information and Communication Technology Convergence (ICTC) · doi:10.1109/ictc62082.2024.10827273 · Cited by 5
Synth4Seg—Learning Defect Data Synthesis for Defect Segmentation Using Bi-Level Optimization
Mou, S., Vemulapalli, R., Li, S., Liu, Y., Thomas, C., Cao, M., Bai, H., Tuzel, O., Huang, P., Shan, J., et al. (2025) · IEEE Transactions on Automation Science and Engineering · doi:10.1109/tase.2025.3583713 · Cited by 5
MST: Multiscale Flow-Based Student–Teacher Network for Unsupervised Anomaly Detection
Yang, Y., Yang, Y., Zhou, S., Gao, Y., Zhu, Y., Wan, X., Hu, W., & Jiang, X. (2024) · Electronics · doi:10.3390/electronics13163224 · Cited by 4
Font conversion for steel product number recognition: A conditioned diffusion model approach
Lee, T.-H., Choi, H., Kim, B. J., Jang, H., Lee, D., & Kim, S. W. (2025) · Advanced Engineering Informatics · doi:10.1016/j.aei.2025.103368 · Cited by 3
Comparison of unsupervised image anomaly detection models for sheet metal glue lines
Chen, S., Bandaru, S., Marti, S., Bekar, E. T., & Skoogh, A. (2025) · Engineering Applications of Artificial Intelligence · doi:10.1016/j.engappai.2025.110740 · Cited by 4
Applications and Limits of Image-to-Image Translation Models
Coscia, P., Genovese, A., Scotti, F., & Piuri, V. (2023) · IEEE International Conference on Digital Signal Processing (DSP) · doi:10.1109/dsp58604.2023.10167879 · Cited by 4
Sequential PatchCore: Anomaly Detection for Surface Inspection Using Synthetic Impurities
Mao, R., Fulir, J., Garth, C., & Gospodnetić, P. (2025) · Lecture notes in computer science · doi:10.1007/978-3-031-92805-5_23 · Cited by 3
Ding, H., Chen, J., Ye, H., & Chen, Y. (2025) · Applied Sciences · doi:10.3390/app15147887 · Cited by 4
DefFiller: mask-conditioned generation with diffusion prior for saliency-based defect detection
Tai, Y., Huang, Z., Peng, T., & Zhang, Z. (2025) · The Visual Computer · doi:10.1007/s00371-025-04078-2 · Cited by 3
F-ADMD: Fast anomaly detection via multi-scale guided denoising diffusion model
An, C., Wu, J., & Zhang, H. (2025) · Neurocomputing · doi:10.1016/j.neucom.2025.131305 · Cited by 5
Accurate Industrial Anomaly Detection and Localization Using Weakly-Supervised Residual Transformers
Li, H., Wu, J., Liu, D., Wu, L. Y., Chen, H., & Shen, C. (2026) · IEEE Transactions on Image Processing · doi:10.1109/tip.2026.3659337 · Cited by 15
Metadata
- Authors
- Zhang, G., Cui, K., Hung, T.-Y., & Lu, S.
- Affiliations
- Nanyang Technological University (SG)
- Delta Research Center,Singapore
- Venue
- 2021 IEEE Winter Conference on Applications of Computer Vision (WACV)
- Publisher
- IEEE
- Published
- 2021-01
- Pages
- 2523-2533
- ISSN
- 2472-6737 (ISSN-L)
- OpenAlex
- W3120387510
- Cited by
- 200
- References
- 80
- Citations by year
- 2026: 48 · 2025: 59 · 2024: 43 · 2023: 21 · 2022: 22 · 2021: 7
- FWCI
- 31.92
- Type
- conference paper
- Language
- en
- Open access
- green
- arxiv.org
- Locations
- IEEE Winter Conference on Applications of Computer Vision (publishedVersion)
- arXiv (Cornell University) (submittedVersion)
- DR-NTU (Nanyang Technological University) (submittedVersion)
- arXiv (Cornell University)
- Funders
- National Research Foundation
- Topics
- Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
- Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Generative Adversarial Networks and Image Synthesis
- Physical Sciences › Engineering › Civil and Structural Engineering › Infrastructure Maintenance and Monitoring
- Keywords
- automated defect detection, generative adversarial networks, data scarcity, industrial defect detection
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review