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Patent Quality and Research Productivity: Measuring Innovation with Multiple Indicators

Lanjouw, Jean O., Schankerman, Mark·2004·The Economic Journal

Abstract

We analyse the determinants of the decline in research productivity using panel data on manufacturing firms in the US for the period 1980–93. We focus on three factors: the level of demand, the quality of patents and technological exhaustion. We develop an index of patent ‘quality’ using detailed patent information and show that using multiple indicators substantially reduces the measured variance in quality. Research productivity at the firm level is inversely related to patent quality and the level of demand, as predicted by theory and patent quality is positively associated with the stock market value of firms.

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Crossref · 10.1111/j.1468-0297.2004.00216.x

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Metadata

Authors
Lanjouw, J. O., & Schankerman, M.
Venue
The Economic Journal
Published
2004-04-01
Volume
114
Issue
495
Pages
441-465
ISSN
  • 0013-0133 (ISSN-L)
  • 1468-0297
OpenAlex
W2010635808
Cited by
1,392
References
0
FWCI
58.83
Type
journal article
Language
en
Open access
closed

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.