The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.
Plasma deposition of optical films and coatings: A review
Abstract
Plasma enhanced chemical vapor deposition (PECVD) is being increasingly used for the fabrication of transparent dielectric optical films and coatings. This involves single-layer, multilayer, graded index, and nanocomposite optical thin film systems for applications such as optical filters, antireflective coatings, optical waveguides, and others. Beside their basic optical properties (refractive index, extinction coefficient, optical loss), these systems very frequently offer other desirable “functional” characteristics. These include hardness, scratch, abrasion, and erosion resistance, improved adhesion to various technologically important substrate materials such as polymers, hydrophobicity or hydrophilicity, long-term chemical, thermal, and environmental stability, gas and vapor impermeability, and others. In the present article, we critically review the advances in the development of plasma processes and plasma systems for the synthesis of thin film high and low index optical materials, and in the control of plasma–surface interactions leading to desired film microstructures. We particularly underline those specificities of PECVD, which distinguish it from other conventional techniques for producing optical films (mainly physical vapor deposition), such as fabrication of graded index (inhomogeneous) layers, control of interfaces, high deposition rate at low temperature, enhanced mechanical and other functional characteristics, and industrial scaleup. Advances in this field are illustrated by selected examples of PECVD of antireflective coatings, rugate filters, integrated optical devices, and others.
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Cites
Bruggeman, D. A. G. (1935) · Annalen der Physik · doi:10.1002/andp.19354160705 · Cited by 8,645
Vahedi, V., & Surendra, M. (1995) · Computer Physics Communications · doi:10.1016/0010-4655(94)00171-w · Cited by 1,065
Cited by
Optical Properties and Microstructure of Plasma Deposited Ta2O5 and Nb2O5 Films
Szymanowski, H., Zabeida, O., Klemberg-Sapieha, J. E., & Martinu, L. (2005) · Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films · doi:10.1116/1.1851544 · Cited by 83
Self-citationReactive HiPIMS Deposition of SiO2/Ta2O5 Optical Interference Filters
Hála, M., Vernhes, R., Zabeida, O., Klemberg-Sapieha, J.-E., & Martinu, L. (2014) · Journal of Applied Physics · doi:10.1063/1.4903285 · Cited by 51
Self-citationAdvancements and Challenges in Anti-Reflective Coatings: A Comprehensive Review
Song, J., Kumar, P., Raouf, I., & Kim, H. S. (2025) · Journal of Materials Research and Technology · doi:10.1016/j.jmrt.2025.09.268 · Cited by 12
Metadata
- Authors
- Martinu, L., & Poitras, D.
- Venue
- Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
- Publisher
- American Vacuum Society
- Published
- 2000-11-01
- Volume
- 18
- Issue
- 6
- Pages
- 2619-2645
- ISSN
- 0734-2101 (ISSN-L)
- 1520-8559
- OpenAlex
- W2072494311
- Cited by
- 559
- References
- 2
- FWCI
- 8.97
- Type
- journal article
- Language
- en
- Open access
- closed
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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