The DOI matches its Crossref record.
Practical guide for curve fitting in x-ray photoelectron spectroscopy
Open accessAbstract
The use of peak fitting to extract information from x-ray photoelectron spectroscopy (XPS) data is of growing use and importance. Due to increased instrument accessibility and reliability, the use of XPS instrumentation has significantly increased around the world. However, the increased use has not been matched by the expertise of the new users, and the erroneous application of curve fitting has contributed to ambiguity and confusion in parts of the literature. This guide discusses the physics and chemistry involved in generating XPS spectra, describes good practices for peak fitting, and provides examples of appropriate use along with tools for avoiding mistakes.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Nguyen, K. G., Baragau, I.-A., Gromicova, R., Nicolaev, A., Thomson, S. A. J., Rennie, A., Power, N. P., Sajjad, M. T., & Kellici, S. (2022) · Scientific Reports · doi:10.1038/s41598-022-16893-x · Cited by 269
Laser Excitation of the Th 229 Nuclear Isomeric Transition in a Solid-State Host
Elwell, R., Schneider, C., Jeet, J., Terhune, J. E. S., Morgan, H. W. T., Alexandrova, A. N., Tran Tan, H. B., Derevianko, A., & Hudson, E. R. (2024) · Physical Review Letters · doi:10.1103/physrevlett.133.013201 · Cited by 126
Metadata
- Authors
- Major, G. H., Fairley, N., Sherwood, P. M. A., Linford, M. R., Terry, J., Fernandez, V., & Artyushkova, K.
- Venue
- Journal of Vacuum Science & Technology A
- Publisher
- American Vacuum Society
- Published
- 2020-10-06
- Volume
- 38
- Issue
- 6
- ISSN
- 0734-2101 (ISSN-L)
- 1520-8559
- OpenAlex
- W3091848290
- Cited by
- 588
- References
- 0
- FWCI
- 18.94
- Type
- journal article
- Language
- en
- Open access
- green
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Practical guide for curve fitting in x-ray photoelectron spectroscopy. https://app.cochat.ai/papers/10.1116/6.0000377
- The paper
- Major, G. H., Fairley, N., Sherwood, P. M. A., Linford, M. R., Terry, J., Fernandez, V., & Artyushkova, K. (2020). Practical guide for curve fitting in x-ray photoelectron spectroscopy. Journal of Vacuum Science & Technology A. https://doi.org/10.1116/6.0000377
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
