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Scientific Charge-Coupled Devices
Abstract
The charge-coupled device dominates an ever-increasing variety of scientific imaging and spectroscopy applications. Recent experience indicates, however, that the full potential of CCD performance lies well beyond that realized in devices currently available. Test data suggest that major improvements are feasible in spectral response, charge collection, charge transfer, and readout noise. These properties, their measurement in existing CCDs, and their potential for future improvement are discussed in this paper.
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Citations
Cited by
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Luka, J., Fridrich, J., & Goljan, M. (2006) · IEEE Transactions on Information Forensics and Security · doi:10.1109/tifs.2006.873602 · Cited by 1,328
Determining Image Origin and Integrity Using Sensor Noise
Chen, M., Fridrich, J., Goljan, M., & Lukas, J. (2008) · IEEE Transactions on Information Forensics and Security · doi:10.1109/tifs.2007.916285 · Cited by 893
Neural computations underlying arbitration between model-based and model-free learning
Lee, S. W., Shimojo, S., & O’Doherty, J. P. (2014) · Neuron · doi:10.1016/j.neuron.2013.11.028 · Cited by 642
Localization Accuracy in Single-Molecule Microscopy
Ober, R. J., Ram, S., & Ward, E. S. (2004) · Biophysical Journal · doi:10.1016/s0006-3495(04)74193-4 · Cited by 587
Content-Adaptive Steganography by Minimizing Statistical Detectability
Sedighi, V., Cogranne, R., & Fridrich, J. (2016) · IEEE Transactions on Information Forensics and Security · doi:10.1109/tifs.2015.2486744 · Cited by 573
Metadata
- Authors
- Janesick, J. R., Elliott, T., Collins, S., Blouke, M. M., & Freeman, J.
- Venue
- Optical Engineering
- Publisher
- SPIE-Intl Soc Optical Eng
- Published
- 1987-08-01
- Volume
- 26
- Issue
- 8
- Pages
- 692-714
- ISSN
- 0091-3286 (ISSN-L)
- OpenAlex
- W1970928574
- Cited by
- 862
- References
- 0
- FWCI
- 8.69
- Type
- journal article
- Language
- en
- Open access
- closed
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- Janesick, J. R., Elliott, T., Collins, S., Blouke, M. M., & Freeman, J. (1987). Scientific Charge-Coupled Devices. Optical Engineering. https://doi.org/10.1117/12.7974139
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