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Cited by 3,366

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Ultrahigh Strength and High Electrical Conductivity in Copper

Lu, Lei, Shen, Yongfeng, Chen, Xianhua, Qian, Lihua, Lu, K.·2004·Science

Abstract

Methods used to strengthen metals generally also cause a pronounced decrease in electrical conductivity, so that a tradeoff must be made between conductivity and mechanical strength. We synthesized pure copper samples with a high density of nanoscale growth twins. They showed a tensile strength about 10 times higher than that of conventional coarse-grained copper, while retaining an electrical conductivity comparable to that of pure copper. The ultrahigh strength originates from the effective blockage of dislocation motion by numerous coherent twin boundaries that possess an extremely low electrical resistivity, which is not the case for other types of grain boundaries.

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Metadata

Authors
Lu, L., Shen, Y., Chen, X., Qian, L., & Lu, K.
Venue
Science
Published
2004-04-16
Volume
304
Issue
5669
Pages
422-426
ISSN
  • 0036-8075 (ISSN-L)
  • 1095-9203
OpenAlex
W2040028885
Cited by
3,366
References
0
FWCI
28.12
Type
journal article
Language
en
Open access
closed

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.