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Scanning Interferometric Apertureless Microscopy: Optical Imaging at 10 Angstrom Resolution

Zenhausern, F., Martin, Y., Wickramasinghe, H. K.·1995·Science

Abstract

Interferometric near-field optical microscopy achieving a resolution of 10 angstroms is demonstrated. The scattered electric field variation caused by a vibrating probe tip in close proximity to a sample surface is measured by encoding it as a modulation in the optical phase of one arm of an interferometer. Unlike in regular near-field optical microscopes, where the contrast results from a weak source (or aperture) dipole interacting with the polarizability of the sample, the present form of imaging relies on a fundamentally different contrast mechanism: sensing the dipole-dipole coupling of two externally driven dipoles (the tip and sample dipoles) as their spacing is modulated.

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Metadata

Authors
Zenhausern, F., Martin, Y., & Wickramasinghe, H. K.
Venue
Science
Published
1995-08-25
Volume
269
Issue
5227
Pages
1083-1085
ISSN
  • 0036-8075 (ISSN-L)
  • 1095-9203
OpenAlex
W2039945745
Cited by
692
References
0
FWCI
29.27
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Scanning Interferometric Apertureless Microscopy: Optical Imaging at 10 Angstrom Resolution. https://app.cochat.ai/papers/10.1126/science.269.5227.1083
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Zenhausern, F., Martin, Y., & Wickramasinghe, H. K. (1995). Scanning Interferometric Apertureless Microscopy: Optical Imaging at 10 Angstrom Resolution. Science. https://doi.org/10.1126/science.269.5227.1083

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