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Cited by 1,032

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Probing Electrical Transport in Nanomaterials: Conductivity of Individual Carbon Nanotubes

Dai, Hongjie, Wong, Eric W., Lieber, Charles M.·1996·Science

Abstract

A general approach has been developed to determine the conductivity of individual nanostructures while simultaneously recording their structure. Conventional lithography has been used to contact electrically single ends of nanomaterials, and a force microscope equipped with a conducting probe tip has been used to map simultaneously the structure and resistance of the portion of the material protruding from the macroscopic contact. Studies of individual carbon nanotubes demonstrate that the structurally most perfect nanotubes have resistivities an order of magnitude lower than those found previously and that defects in the nanotube structure cause substantial increases in the resistivity.

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Crossref · 10.1126/science.272.5261.523

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Metadata

Authors
Dai, H., Wong, E. W., & Lieber, C. M.
Venue
Science
Published
1996-04-26
Volume
272
Issue
5261
Pages
523-526
ISSN
  • 0036-8075 (ISSN-L)
  • 1095-9203
OpenAlex
W2063219977
Cited by
1,032
References
0
FWCI
34.45
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Probing Electrical Transport in Nanomaterials: Conductivity of Individual Carbon Nanotubes. https://app.cochat.ai/papers/10.1126/science.272.5261.523
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Dai, H., Wong, E. W., & Lieber, C. M. (1996). Probing Electrical Transport in Nanomaterials: Conductivity of Individual Carbon Nanotubes. Science. https://doi.org/10.1126/science.272.5261.523

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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.