The DOI matches its Crossref record.
Defects in Semiconductors: Some Fatal, Some Vital
Abstract
REVIEW The role of defects as essential entities in semiconductor materials is reviewed. Early experiments with semiconductors were hampered by the extreme sensitivity of the electronic properties to minute concentrations of impurities. Semiconductors were viewed as a family of solids with irreproducible properties. Scientific efforts overcame this idiosyncrasy and turned the art of impurity doping into today's exceedingly useful and reproducible technology that is used to control precisely electrical conductivity, composition, and minority-carrier lifetimes over wide ranges. Native defects such as vacancies and self-interstitials control basic processes, foremost self- and dopant diffusion. The structural properties of dislocations and higher dimensional defects have been studied with atomic resolution, but a thorough theoretical understanding of their electronic properties is incomplete. Reactions between defects within the host lattices are increasingly better understood and are used for gettering and electrical passivation of unwanted impurities. Metastable defects such as DX centers and the EL2-related arsenic antisite are briefly discussed. The recent development of isotopically controlled semiconductors has created new research opportunities in this field.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Properties and potential optoelectronic applications of lead halide perovskite nanocrystals
Kovalenko, M. V., Protesescu, L., & Bodnarchuk, M. I. (2017) · Science · doi:10.1126/science.aam7093 · Cited by 2,652
Engineering heterogeneous semiconductors for solar water splitting
Li, X., Yu, J., Low, J., Fang, Y., Xiao, J., & Chen, X. (2015) · Journal of Materials Chemistry A · doi:10.1039/c4ta04461d · Cited by 1,888
Synthesis of Carbon Nitride Semiconductors in Sulfur Flux for Water Photoredox Catalysis
Zhang, J., Zhang, M., Zhang, G., & Wang, X. (2012) · ACS Catalysis · doi:10.1021/cs300167b · Cited by 441
Oxygen vacancies: The (in)visible friend of oxide electronics
Gunkel, F., Christensen, D. V., Chen, Y. Z., & Pryds, N. (2020) · Applied Physics Letters · doi:10.1063/1.5143309 · Cited by 406
Ye, J., Byranvand, M. M., Martínez, C. O., Hoye, R. L. Z., Saliba, M., & Polavarapu, L. (2021) · Angewandte Chemie International Edition · doi:10.1002/anie.202102360 · Cited by 389
Metadata
- Authors
- Queisser, H. J., & Haller, E. E.
- Venue
- Science
- Published
- 1998-08-14
- Volume
- 281
- Issue
- 5379
- Pages
- 945-950
- ISSN
- 0036-8075 (ISSN-L)
- 1095-9203
- OpenAlex
- W2092724390
- Cited by
- 539
- References
- 0
- FWCI
- 3.68
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Defects in Semiconductors: Some Fatal, Some Vital. https://app.cochat.ai/papers/10.1126/science.281.5379.945
- The paper
- Queisser, H. J., & Haller, E. E. (1998). Defects in Semiconductors: Some Fatal, Some Vital. Science. https://doi.org/10.1126/science.281.5379.945
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.