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P-Type Conduction in Mg-Doped GaN Treated with Low-Energy Electron Beam Irradiation (LEEBI)

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Amano, Hiroshi, Kito, Masahiro, Hiramatsu, Kazumasa, Akasaki, Isamu·1989·Japanese Journal of Applied Physics

Abstract

Distinct p-type conduction is realized with Mg-doped GaN by the low-energy electron-beam irradiation (LEEBI) treatment, and the properties of the GaN p-n junction LED are reported for the first time. It was found that the LEEBI treatment drastically lowers the resistivity and remarkably enhances the PL efficiency of MOVPE-grown Mg-doped GaN. The Hall effect measurement of this Mg-doped GaN treated with LEEBI at room temperature showed that the hole concentration is ∼2·10 16 cm-3, the hole mobility is ∼8 cm 2/V·s and the resistivity is ∼35 Ω·cm. The p-n junction LED using Mg-doped GaN treated with LEEBI as the p-type material showed strong near-band-edge emission due to the hole injection from the p-layer to the n-layer at room temperature.

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Metadata

Authors
Amano, H., Kito, M., Hiramatsu, K., & Akasaki, I.
Venue
Japanese Journal of Applied Physics
Published
1989-12-01
Volume
28
Issue
12A
Pages
L2112
ISSN
  • 0021-4922 (ISSN-L)
  • 1347-4065
OpenAlex
W2069099261
Cited by
2,002
References
0
FWCI
4.97
Type
journal article
Language
en
Open access
bronze

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CoChat. (2026). Citation check: P-Type Conduction in Mg-Doped GaN Treated with Low-Energy Electron Beam Irradiation (LEEBI). https://app.cochat.ai/papers/10.1143/jjap.28.l2112
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Amano, H., Kito, M., Hiramatsu, K., & Akasaki, I. (1989). P-Type Conduction in Mg-Doped GaN Treated with Low-Energy Electron Beam Irradiation (LEEBI). Japanese Journal of Applied Physics. https://doi.org/10.1143/jjap.28.l2112

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