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Base-Metal Electrode-Multilayer Ceramic Capacitors: Past, Present and Future Perspectives

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Kishi, Hiroshi, Mizuno, Youichi, Chazono, Hirokazu·2003·Japanese Journal of Applied Physics

Abstract

Multilayer ceramic capacitor (MLCC) production and sales figures are the highest among fine-ceramic products developed in the past 30 years. The total worldwide production and sales reached 550 billion pieces and 6 billion dollars, respectively in 2000. In the course of progress, the development of base-metal electrode (BME) technology played an important role in expanding the application area. In this review, the recent progress in MLCCs with BME nickel (Ni) electrodes is reviewed from the viewpoint of nonreducible dielectric materials. Using intermediate-ionic-size rare-earth ion (Dy 2 O 3 , Ho 2 O 3 , Er 2 O 3 , Y 2 O 3 ) doped BaTiO 3 ( A B O 3 )-based dielectrics, highly reliable Ni-MLCCs with a very thin layer below 2 µm in thickness have been developed. The effect of site occupancy of rare-earth ions in BaTiO 3 on the electrical properties and microstructure of nonreducible dielectrics is studied systematically. It appears that intermediate-ionic-size rare-earth ions occupy both A - and B -sites in the BaTiO 3 lattice and effectively control the donor/acceptor dopant ratio and microstructural evolution. The relationship between the electrical properties and the microstructure of Ni-MLCCs is also presented.

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Metadata

Authors
Kishi, H., Mizuno, Y., & Chazono, H.
Venue
Japanese Journal of Applied Physics
Published
2003-01-15
Volume
42
Issue
Part 1, No. 1
Pages
1-15
ISSN
  • 0021-4922 (ISSN-L)
  • 1347-4065
OpenAlex
W2072471810
Cited by
1,171
References
1
FWCI
20.77
Type
journal article
Language
en
Open access
bronze

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CoChat. (2026). Citation check: Base-Metal Electrode-Multilayer Ceramic Capacitors: Past, Present and Future Perspectives. https://app.cochat.ai/papers/10.1143/jjap.42.1
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Kishi, H., Mizuno, Y., & Chazono, H. (2003). Base-Metal Electrode-Multilayer Ceramic Capacitors: Past, Present and Future Perspectives. Japanese Journal of Applied Physics. https://doi.org/10.1143/jjap.42.1

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