Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 213

The DOI matches its Crossref record.

Evaluating static analysis defect warnings on production software

Ayewah, Nathaniel, Pugh, William, Morgenthaler, J. David, Penix, John, Zhou, YuQian·2007·Proceedings of the 7th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering

Abstract

Static analysis tools for software defect detection are becoming widely used in practice. However, there is little public information regarding the experimental evaluation of the accuracy and value of the warnings these tools report. In this paper, we discuss the warnings found by FindBugs, a static analysis tool that finds defects in Java programs. We discuss the kinds of warnings generated and the classification of warnings into false positives, trivial bugs and serious bugs. We also provide some insight into why static analysis tools often detect true but trivial bugs, and some information about defect warnings across the development lifetime of software release. We report data on the defect warnings in Sun's Java 6 JRE, in Sun's Glassfish JEE server, and in portions of Google's Java codebase. Finally, we report on some experiences from incorporating static analysis into the software development process at Google.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1145/1251535.1251536

Cites

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cited by

See all 213

Metadata

Authors
Ayewah, N., Pugh, W., Morgenthaler, J. D., Penix, J., & Zhou, Y.
Venue
Proceedings of the 7th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering
Publisher
ACM
Published
2007-06-13
Pages
1-8
OpenAlex
W2125343911
Cited by
213
References
0
FWCI
9.69
Type
conference paper
Language
en
Open access
closed

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Evaluating static analysis defect warnings on production software. https://app.cochat.ai/papers/10.1145/1251535.1251536
The paper
Ayewah, N., Pugh, W., Morgenthaler, J. D., Penix, J., & Zhou, Y. (2007). Evaluating static analysis defect warnings on production software. Proceedings of the 7th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering. https://doi.org/10.1145/1251535.1251536

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.