The DOI matches its Crossref record; 64 of the 64 references it cites were found in a registry or an index.
Automated parameter optimization of classification techniques for defect prediction models
Abstract
Defect prediction models are classifiers that are trained to identify defect-prone software modules. Such classifiers have configurable parameters that control their characteristics (e.g., the number of trees in a random forest classifier). Recent studies show that these classifiers may underperform due to the use of suboptimal default parameter settings. However, it is impractical to assess all of the possible settings in the parameter spaces. In this paper, we investigate the performance of defect prediction models where Caret --- an automated parameter optimization technique --- has been applied. Through a case study of 18 datasets from systems that span both proprietary and open source domains, we find that (1) Caret improves the AUC performance of defect prediction models by as much as 40 percentage points; (2) Caret-optimized classifiers are at least as stable as (with 35% of them being more stable than) classifiers that are trained using the default settings; and (3) Caret increases the likelihood of producing a top-performing classifier by as much as 83%. Hence, we conclude that parameter settings can indeed have a large impact on the performance of defect prediction models, suggesting that researchers should experiment with the parameters of the classification techniques. Since automated parameter optimization techniques like Caret yield substantially benefits in terms of performance improvement and stability, while incurring a manageable additional computational cost, they should be included in future defect prediction studies.
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Cited by
An Empirical Comparison of Model Validation Techniques for Defect Prediction Models
Tantithamthavorn, C., McIntosh, S., Hassan, A. E., & Matsumoto, K. (2017) · IEEE Transactions on Software Engineering · doi:10.1109/tse.2016.2584050 · Cited by 574
Self-citationAn Empirical Study of Model-Agnostic Techniques for Defect Prediction Models
Jiarpakdee, J., Tantithamthavorn, C. K., Dam, H. K., & Grundy, J. (2022) · IEEE Transactions on Software Engineering · doi:10.1109/tse.2020.2982385 · Cited by 148
Self-citationPredicting Defective Lines Using a Model-Agnostic Technique
Wattanakriengkrai, S., Thongtanunam, P., Tantithamthavorn, C., Hata, H., & Matsumoto, K. (2022) · IEEE Transactions on Software Engineering · doi:10.1109/tse.2020.3023177 · Cited by 137
Self-citationMenzies, T. (2020) · IEEE Software · doi:10.1109/ms.2019.2954841 · Cited by 43
Metadata
- Authors
- Tantithamthavorn, C., McIntosh, S., Hassan, A. E., & Matsumoto, K.
- Venue
- Proceedings of the 38th International Conference on Software Engineering
- Publisher
- ACM
- Published
- 2016-05-14
- Pages
- 321-332
- ISSN
- 0270-5257 (ISSN-L)
- OpenAlex
- W2367798545
- Cited by
- 331
- References
- 64
- FWCI
- 41.88
- Type
- conference paper
- Language
- en
- Open access
- closed
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