The DOI matches its Crossref record; 70 of the 70 references it cites were found in a registry or an index.
Machine Learning for Electronic Design Automation: A Survey
Open accessAbstract
With the down-scaling of CMOS technology, the design complexity of very large-scale integrated is increasing. Although the application of machine learning (ML) techniques in electronic design automation (EDA) can trace its history back to the 1990s, the recent breakthrough of ML and the increasing complexity of EDA tasks have aroused more interest in incorporating ML to solve EDA tasks. In this article, we present a comprehensive review of existing ML for EDA studies, organized following the EDA hierarchy.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
XGBoost: A Scalable Tree Boosting System
Chen, T., & Guestrin, C. (2016) · Proceedings of the 22nd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining · doi:10.1145/2939672.2939785 · Cited by 54,569
Multilayer feedforward networks are universal approximators
Hornik, K., Stinchcombe, M., & White, H. (1989) · Neural Networks · doi:10.1016/0893-6080(89)90020-8 · Cited by 21,728
Classification and Regression by randomForest
Liaw, A. I., & Wiener, M. C. (2007) · Cited by 18,594
A training algorithm for optimal margin classifiers
Boser, B. E., Guyon, I. M., & Vapnik, V. N. (1992) · Proceedings of the fifth annual workshop on Computational learning theory · doi:10.1145/130385.130401 · Cited by 11,992
TensorFlow: A system for large-scale machine learning
Abadi, M., Barham, P., Chen, J., Chen, Z., Davis, A., Dean, J., Devin, M., Ghemawat, S., Irving, G., Isard, M., et al. (2016) · arXiv (Cornell University) · doi:10.48550/arxiv.1605.08695 · Cited by 11,822
UNet++: A Nested U-Net Architecture for Medical Image Segmentation
Zhou, Z., Rahman Siddiquee, M. M., Tajbakhsh, N., & Liang, J. (2018) · Lecture Notes in Computer Science · doi:10.1007/978-3-030-00889-5_1 · Cited by 9,610
Mastering the game of Go without human knowledge
Silver, D., Schrittwieser, J., Simonyan, K., Antonoglou, I., Huang, A., Guez, A., Hubert, T., Baker, L., Lai, M., Bolton, A., et al. (2017) · Nature · doi:10.1038/nature24270 · Cited by 9,084
Multilayer feedforward networks are universal approximators
HornikK., StinchcombeM., & WhiteH. (1989) · Neural Networks · doi:10.5555/70405.70408 · Cited by 9,081
Chaff: engineering an efficient SAT solver
Moskewicz, M. W., Madigan, C. F., Zhao, Y., Zhang, L., & Malik, S. (2001) · Proceedings of the 38th conference on Design automation - DAC '01 · doi:10.1145/378239.379017 · Cited by 2,940
ABC: An Academic Industrial-Strength Verification Tool
Brayton, R., & Mishchenko, A. (2010) · Lecture Notes in Computer Science · doi:10.1007/978-3-642-14295-6_5 · Cited by 944
Cited by
Perez-Cerrolaza, J., Abella, J., Borg, M., Donzella, C., Cerquides, J., Cazorla, F. J., Englund, C., Tauber, M., Nikolakopoulos, G., & Flores, J. L. (2024) · ACM Computing Surveys · doi:10.1145/3626314 · Cited by 185
Metadata
- Authors
- Huang, G., Hu, J., He, Y., Liu, J., Ma, M., Shen, Z., Wu, J., Xu, Y., Zhang, H., Zhong, K., Ning, X., Ma, Y., Yang, H., Yu, B., Yang, H., & Wang, Y.
- Venue
- ACM Transactions on Design Automation of Electronic Systems
- Published
- 2021-06-05
- Volume
- 26
- Issue
- 5
- Pages
- 1-46
- ISSN
- 1084-4309 (ISSN-L)
- 1557-7309
- OpenAlex
- W3169517138
- Cited by
- 341
- References
- 70
- FWCI
- 13.61
- Type
- journal article
- Language
- en
- Open access
- green
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Machine Learning for Electronic Design Automation: A Survey. https://app.cochat.ai/papers/10.1145/3451179
- The paper
- Huang, G., Hu, J., He, Y., Liu, J., Ma, M., Shen, Z., Wu, J., Xu, Y., Zhang, H., Zhong, K., Ning, X., Ma, Y., Yang, H., Yu, B., Yang, H., & Wang, Y. (2021). Machine Learning for Electronic Design Automation: A Survey. ACM Transactions on Design Automation of Electronic Systems. https://doi.org/10.1145/3451179
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.