Transversal Wavelength-Independent Microradiography, a Method for Monitoring Caries Lesions over Time, Validated with Transversal Microradiography

Abstract

This paper describes a microradiographic method for measuring mineral concentration in a transversal geometry with thick (≤3.2 mm) sections: transversal wavelength-independent microradiography (T-WIM). It was tested on bovine enamel and dentin samples in vitro, and the results were validated with those of transversal microradiography (TMR). 48 enamel and 48 dentin samples (3.2 × 3.2 × 1.5 mm) were embedded in acrylic resin, randomly divided into six groups of 8 dentin or 8 enamel samples, and demineralized for 0 (sound control), 1, 2, 3, 4, or 5 weeks. For T-WIM, samples were imaged on film with polychromatic 40-kV Cu X-rays with an Al (0.25 mm)/Ni (0.02 mm) filter together with an aluminium/zinc step wedge. TMR slices (about 80 µm for enamel and about 130 µm for dentine) were subsequently cut from the centre of the samples and subjected to TMR. Microradiographs from both methods were digitized and image analysis software was used to calculate lesion depth and mineral loss. The relations between T-WIM and TMR results for mineral loss (ΔZ) and lesion depth were nearly linear (r ≧ 0.96) for both enamel and dentin. The slopes of the regression lines were between 0.99 and 1.02 except for ΔZ in dentine, which was 0.89. It was concluded that T-WIM is a suitable method for TMR on thick samples.