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Accurate quantitative analysis of clay and other minerals in sandstones by XRD: comparison of a Rietveld and a reference intensity ratio (RIR) method and the importance of sample preparation
Abstract
X-ray diffraction is used widely for quantitative analysis of geological samples but studies which document the accuracy of the methods employed are not numerous. Synthetic sandstones of known composition are used to compare a ‘routine application’ of a Rietveld and a reference intensity ratio (RIR) method of quantitative phase analysis. Both methods give similar results accurate to within ~±3 wt.% at the 95% confidence level. The high degree of accuracy obtained is believed to depend to a large extent on the spray-drying method of sample preparation used to eliminate preferred orientation.
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Cites
X-Ray Diffraction and the Identification and Analysis of Clay Minerals
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Clay Minerals for Petroleum Geologists and Engineers
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Miao, S., Shi, J., Sun, Y., Zhang, P., Shen, Z., Nian, H., Huang, J., Wang, X., & Zhang, P. (2018) · Applied Clay Science · doi:10.1016/j.clay.2018.02.003 · Cited by 20
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Balci, N., & Demirel, C. (2016) · Minerals · doi:10.3390/min6040122 · Cited by 16
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Metadata
- Authors
- Hillier, S.
- Venue
- Clay Minerals
- Publisher
- Mineralogical Society
- Published
- 2000-03
- Volume
- 35
- Issue
- 1
- Pages
- 291-302
- ISSN
- 0009-8558 (ISSN-L)
- 1471-8030
- OpenAlex
- W1978146781
- Cited by
- 395
- References
- 16
- FWCI
- 1.70
- Type
- journal article
- Language
- en
- Open access
- closed
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- Hillier, S. (2000). Accurate quantitative analysis of clay and other minerals in sandstones by XRD: comparison of a Rietveld and a reference intensity ratio (RIR) method and the importance of sample preparation. Clay Minerals. https://doi.org/10.1180/000985500546666
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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