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New measurement system for fault location in optical waveguide devices based on an interferometric technique
Abstract
A new measurement system for fault location in optical waveguide devices is presented. The system consists of a fiber-optic Mach-Zehnder and a bulk-type Michelson interferometers. The spatial resolution of the scatter distribution is <380 microm, which is limited by the averaging time. The minimum detectable backscattered power is -116 dB relative to the light power propagating in the waveguides. Preliminary experimental results using single-mode fibers <10 cm long are demonstrated.
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Cited by
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Drexler, W., Morgner, U., Ghanta, R. K., Kärtner, F. X., Schuman, J. S., & Fujimoto, J. G. (2001) · Nature Medicine · doi:10.1038/86589 · Cited by 962
Measurement of optical properties of biological tissues by low-coherence reflectometry
Schmitt, J. M., Knüttel, A., & Bonner, R. F. (1993) · Applied Optics · doi:10.1364/ao.32.006032 · Cited by 355
Haruna, M., Ohmi, M., Mitsuyama, T., Tajiri, H., Maruyama, H., & Hashimoto, M. (1998) · Optics Letters · doi:10.1364/ol.23.000966 · Cited by 142
Quantum optical coherence tomography of a biological sample
Nasr, M. B., Goode, D. P., Nguyen, N., Rong, G., Yang, L., Reinhard, B. M., Saleh, B. E. A., & Teich, M. C. (2009) · Optics Communications · doi:10.1016/j.optcom.2008.11.061 · Cited by 79
Metadata
- Authors
- Takada, K., Yokohama, I., Chida, K., & Noda, J.
- Venue
- Applied Optics
- Publisher
- Optica Publishing Group
- Published
- 1987-05-01
- Volume
- 26
- Issue
- 9
- Pages
- 1603
- ISSN
- 0003-6935 (ISSN-L)
- 1539-4522
- OpenAlex
- W2056433442
- Cited by
- 371
- References
- 0
- FWCI
- 5.11
- Type
- journal article
- Language
- en
- Open access
- closed
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- CoChat. (2026). Citation check: New measurement system for fault location in optical waveguide devices based on an interferometric technique. https://app.cochat.ai/papers/10.1364/ao.26.001603
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- Takada, K., Yokohama, I., Chida, K., & Noda, J. (1987). New measurement system for fault location in optical waveguide devices based on an interferometric technique. Applied Optics. https://doi.org/10.1364/ao.26.001603
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