The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.
Mueller polarimetric imaging system with liquid crystals
Abstract
We present a new polarimetric imaging system based on liquid-crystal modulators, a spectrally filtered white-light source, and a CCD camera. The whole Mueller matrix image of the sample is measured in approximately 5 s in the transmission mode. The instrument design, together with an original and easy-to-operate calibration procedure, provides high accuracy over a wide spectral range (500-700 nm). This accuracy has been assessed by measurement of a linear polarizer at different orientations and a thick wedged quartz plate as an example of a partially depolarized retarder. Polarimetric images of a stained hepatic biopsy with significant fibrosis have been taken at several wavelengths. The optical properties of Picrosirius Red stained collagen (diattenuation, retardance, and polarizance) have been measured independently from each other between 500 and 700 nm.
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Citations
Cites
Interpretation of Mueller matrices based on polar decomposition
Lu, S.-Y., & Chipman, R. A. (1996) · Journal of the Optical Society of America A · doi:10.1364/josaa.13.001106 · Cited by 1,409
Cited by
Polarimetric imaging of uterine cervix: a case study
Pierangelo, A., Nazac, A., Benali, A., Validire, P., Cohen, H., Novikova, T., Ibrahim, B. H., Manhas, S., Fallet, C., Antonelli, M.-R., et al. (2013) · Optics Express · doi:10.1364/oe.21.014120 · Cited by 255
Metadata
- Authors
- Laude-Boulesteix, B., De Martino, A., Drévillon, B., & Schwartz, L.
- Venue
- Applied Optics
- Publisher
- Optica Publishing Group
- Published
- 2004-05-10
- Volume
- 43
- Issue
- 14
- Pages
- 2824
- ISSN
- 0003-6935 (ISSN-L)
- 1539-4522
- OpenAlex
- W1966670291
- Cited by
- 177
- References
- 1
- FWCI
- 4.04
- Type
- journal article
- Language
- en
- Open access
- closed
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- Laude-Boulesteix, B., De Martino, A., Drévillon, B., & Schwartz, L. (2004). Mueller polarimetric imaging system with liquid crystals. Applied Optics. https://doi.org/10.1364/ao.43.002824
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