Terahertz paintmeter for noncontact monitoring of thickness and drying progress in paint film
Abstract
We propose a paintmeter for noncontact and remote monitoring of the thickness and drying progress of a paint film based on the time-of-flight measurement of the echo signal of a terahertz (THz) electromagnetic pulse. The proposed method is effectively applied to two-dimensional mapping of the painting thickness distribution for single-layer and multilayer paint films. Furthermore, adequate parameters for the drying progress are extracted from the THz pulse-echo signal and effectively applied to monitor the wet-to-dry transformation. The THz paintmeter can be a powerful tool for quality control of the paint film on the in-process monitoring of car body painting.
Integrity signals
Registry
Cites
Statistics
Claims the paper makes
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
Terahertz nondestructive testing can measure the thickness of common plastics and paint layers.
“Thus, THz nondestructive testing can be used to determine the thickness of common plastics 1 and paint layers. 2”
From Highly sensitive terahertz measurement of layer thickness using a two-cylinder waveguide sensor (2010) · cites this paper as [2]
Terahertz radiation passes efficiently through most dielectric materials.
“The terahertz ͑THz͒ frequency band ͑located between 100 GHz and 10 THz, corresponding to wavelengths between 3000 and 30 m in free-space͒ efficiently penetrates most dielectrics.”
From Highly sensitive terahertz measurement of layer thickness using a two-cylinder waveguide sensor (2010) · cites this paper as [2]
The citation lists haven’t been fetched yet
References 9 · Cited by 273
- Authors
- Yasui, T., Yasuda, T., Sawanaka, K.-I., & Araki, T.
- Affiliations
- The University of Osaka (JP)
- Venue
- Applied Optics
- Publisher
- Optica Publishing Group
- Published
- 2005-11-10
- Volume
- 44
- Issue
- 32
- Pages
- 6849
- ISSN
- 0003-6935 (ISSN-L)
- 1539-4522
- OpenAlex
- W2096230140
- Cited by
- 273
- References
- 9
- Citations by year
- 2026: 3 · 2025: 10 · 2024: 12 · 2023: 14 · 2022: 5 · 2021: 17 · 2020: 17 · 2019: 20 · 2018: 19 · 2017: 11 · 2016: 12 · 2015: 19 · 2014: 28 · 2013: 18 · 2012: 12
- FWCI
- 6.65
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Applied Optics (publishedVersion)
- PubMed (publishedVersion)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
- Physical Sciences › Engineering › Mechanics of Materials › Thermography and Photoacoustic Techniques
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Microwave and Dielectric Measurement Techniques
- Keywords
- non-contact monitoring
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review