Cited by 85

The DOI matches its Crossref record.

Survey of emissivity measurement by radiometric methods

Honner, M., Honnerová, P.·2015·Applied Optics

Abstract

A survey of the state of the art in the field of spectral directional emissivity measurements by using radiometric methods is presented. Individual quantity types such as spectral, band, or total emissivity are defined. Principles of emissivity measurement by various methods (direct and indirect, and calorimetric and radiometric) are discussed. The paper is focused on direct radiometric methods. An overview of experimental setups is provided, including the design of individual parts such as the applied reference sources of radiation, systems of sample clamping and heating, detection systems, methods for the determination of surface temperature, and procedures for emissivity evaluation.

Overview

Integrity signals

Registry

Crossref · 10.1364/ao.54.000669

Cites

Statistics

Recomputing p-values needs the paper’s full text.

Verification

Claims the paper makes

This paper’s full text isn’t openly available, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

Citations

Cites

No references could be resolved yet.

Research works printed but not linked: 58

  1. Ballico, 1995, Appl. Spectrosc., 49, 335, 10.1366/0003702953963607 · DOI
  2. Ishii, 2001, Meas. Sci. Technol., 12, 2103, 10.1088/0957-0233/12/12/311 · DOI
  3. Dai, 2005, J. Phys. Conf. Ser., 13, 63, 10.1088/1742-6596/13/1/015 · DOI
  4. del Campo, 2006, Rev. Sci. Instrum., 77, 113111, 10.1063/1.2393157 · DOI
  5. Monte, 2010, Metrologia, 47, S172, 10.1088/0026-1394/47/2/S14 · DOI
  6. Hay, 2014, Int. J. Thermophys., 35, 1712, 10.1007/s10765-013-1400-8 · DOI
  7. Hsu, 1963, Engineering Heat Transfer
  8. Hottel, 1967, Radiative Heat Transfer
  9. Siegel, 2001, Thermal Radiation Heat Transfer
  10. Hollands, 2004, Thermal Radiation Fundamentals, 10.1615/978-1-56700-203-4.0 · DOI
  11. Hameury, 1998, High Temp. High Press., 30, 223, 10.1068/htec173 · DOI
  12. Kobayashi, 1999, Int. J. Thermophys., 20, 289, 10.1023/A:1021415305603 · DOI
  13. Koirala, 2004, FTIR-Spectroscopic Measurement of Directional Spectral Emissivities of Microstructured Surfaces
  14. Cagran, 2007, Int. J. Thermophys., 28, 581, 10.1007/s10765-007-0183-1 · DOI
  15. Guojin, 2011, Mater. Lett., 65, 1238, 10.1016/j.matlet.2011.01.067 · DOI
  16. Pantinakis, 2001, Int. J. Thermophys., 22, 1843, 10.1023/A:1013103419949 · DOI
  17. Alaruri, 1998, Opt. Eng., 37, 683, 10.1117/1.601868 · DOI
  18. Manara, 2011, Infrared Phys. Technol., 54, 395, 10.1016/j.infrared.2011.06.001 · DOI
  19. Siroux, 1998, Meas. Sci. Technol., 9, 1956, 10.1088/0957-0233/9/12/005 · DOI
  20. Neuer, 1998, Int. J. Thermophys., 19, 917, 10.1023/A:1022607426413 · DOI
  21. Iuchi, 2004, Rev. Sci. Instrum., 75, 5326, 10.1063/1.1818994 · DOI
  22. Wen, 2005, Int. J. Heat Mass Transfer, 48, 1316, 10.1016/j.ijheatmasstransfer.2004.10.003 · DOI
  23. Brandt, 2008, Measurement, 41, 731, 10.1016/j.measurement.2007.10.007 · DOI
  24. Thomas, 1968, J. Sci. Instrum., 1, 311, 10.1088/0022-3735/1/3/310 · DOI
  25. Dvurechensky, 1979, Appl. Phys., 19, 465
  26. Chabal, 1988, Surf. Sci. Rep., 8, 211, 10.1016/0167-5729(88)90011-8 · DOI
  27. Sherman HsuSettle, 1997, Infrared spectroscopy, 247
  28. Domanchin, 2001, Photon. Spec., 35, 112
  29. Vitkovskii, 2009, Therm. Eng., 56, 245, 10.1134/S0040601509030100 · DOI
  30. Rozenbaum, 1999, Rev. Sci. Instrum., 70, 4020, 10.1063/1.1150028 · DOI
  31. Labuhn, 2001, Int. J. Thermophys., 22, 1577, 10.1023/A:1012817726103 · DOI
  32. Monte, 2009, Int. J. Thermophys., 30, 203, 10.1007/s10765-008-0442-9 · DOI
  33. Furukawa, 2000, Rev. Sci. Instrum., 71, 2843, 10.1063/1.1150701 · DOI
  34. Geunsik, 2009, J. Phys. D, 42, 155412, 10.1088/0022-3727/42/15/155412 · DOI
  35. Huang, 2011, Thin Solid Films, 519, 3100, 10.1016/j.tsf.2010.12.157 · DOI
  36. Ishii, 2003, A Fourier-transform spectrometer for accurate thermometric applications at low temperatures, 7, 705
  37. Meng, 2011, Mater. Des., 32, 377, 10.1016/j.matdes.2010.06.007 · DOI
  38. Sova, 1998, Infrared Phys. Technol., 39, 251, 10.1016/S1350-4495(98)00011-5 · DOI
  39. Tazawa, 2004, Sol. Energy Mater. Sol. Cells, 84, 459, 10.1016/j.solmat.2003.12.017 · DOI
  40. Monte, 2010, High Temp. High Press., 39, 151
  41. Clausen, 1996, Appl. Opt., 35, 5683, 10.1364/AO.35.005683 · DOI
  42. Postlethwait, 1994, J. Thermophys. Heat Transfer, 8, 412, 10.2514/3.558 · DOI
  43. Takeuti, 1995, Appl. Phys. Lett., 67, 2206, 10.1063/1.115104 · DOI
  44. Markham, 1993, Rev. Sci. Instrum., 64, 2515, 10.1063/1.1143913 · DOI
  45. Hernandez, 2009, Measurement, 42, 836, 10.1016/j.measurement.2009.01.012 · DOI
  46. Krenek, 2010, Int. J. Thermophys., 31, 998, 10.1007/s10765-010-0767-z · DOI
  47. Rousseau, 2005, Int. J. Thermophys., 26, 1277, 10.1007/s10765-005-6726-4 · DOI
  48. González-Fernández, 2012, J. Alloys Compd., 513, 101, 10.1016/j.jallcom.2011.09.097 · DOI
  49. Rogalski, 2002, Infrared Phys. Technol., 43, 187, 10.1016/S1350-4495(02)00140-8 · DOI
  50. Rogalski, 2003, Prog. Quantum Electron., 27, 59, 10.1016/S0079-6727(02)00024-1 · DOI
  51. Lopes, 2000, High Temp. High Press., 32, 369, 10.1068/htwu133 · DOI
  52. Gonzáles-Fernández, 2010, Appl. Opt., 49, 2728, 10.1364/AO.49.002728 · DOI
  53. Lindermeir, 1992, Appl. Opt., 31, 4527, 10.1364/AO.31.004527 · DOI
  54. Pérez-Sáez, 2008, Int. J. Thermophys., 29, 1141, 10.1007/s10765-008-0402-4 · DOI
  55. Manara, 2002, High Temp. High Press., 34, 65, 10.1068/htwu309 · DOI
  56. Dufour, 1998, Appl. Opt., 37, 5923, 10.1364/AO.37.005923 · DOI
  57. del Campo, 2010, J. Alloys Compd., 489, 482, 10.1016/j.jallcom.2009.09.091 · DOI
  58. González-Fernández, 2012, J. Alloys Compd., 541, 144, 10.1016/j.jallcom.2012.06.117 · DOI

Cited by

Sorted by citations

Metadata

Authors
Honner, M., & Honnerová, P.
Venue
Applied Optics
Published
2015-01-29
Volume
54
Issue
4
Pages
669
ISSN
  • 1559-128X
  • 2155-3165
Cited by
85
References
0
Language
en
Funders
Ministerstvo školství, mládeže a tělovýchovy (MSMT) (CZ.1.05/2.1.00/03.0088)

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review