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Precision Measurement of Absolute Specular Reflectance with Minimized Systematic Errors

Bennett, H. E., Koehler, W. F.·1960·Journal of the Optical Society of America

Abstract

Instruments for making precision measurements of the specular reflectance at essentially normal incidence in the near ultraviolet, visible, and infrared regions of the spectrum are described. The square of the absolute reflectance is measured, with a resultant increase in measuring precision, and the major sources of systematic error in making reflectance measurements have been reduced or eliminated. The difficulty in making precision reflectance measurements in the infrared, where integrating spheres cannot be used, has been overcome by a unique compensating feature in the infrared reflectometer which prevents the image on the detector from changing size or position because of a slight tilt of the sample. The measurements made with these instruments on high reflectance samples are believed to be good to ±0.001.

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Metadata

Authors
Bennett, H. E., & Koehler, W. F.
Venue
Journal of the Optical Society of America
Published
1960-01-01
Volume
50
Issue
1
Pages
1
ISSN
0030-3941 (ISSN-L)
OpenAlex
W2127356000
Cited by
200
References
0
FWCI
17.09
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Precision Measurement of Absolute Specular Reflectance with Minimized Systematic Errors. https://app.cochat.ai/papers/10.1364/josa.50.000001
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Bennett, H. E., & Koehler, W. F. (1960). Precision Measurement of Absolute Specular Reflectance with Minimized Systematic Errors. Journal of the Optical Society of America. https://doi.org/10.1364/josa.50.000001

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