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Dielectric particle and void resonators for thin film solar cell textures
Open accessAbstract
Using Mie theory and Rigorous Coupled Wave Analysis (RCWA) we compare the properties of dielectric particle and void resonators. We show that void resonators-low refractive index inclusions within a high index embedding medium-exhibit larger bandwidth resonances, reduced peak scattering intensity, different polarization anisotropies, and enhanced forward scattering when compared to their particle (high index inclusions in a low index medium) counterparts. We evaluate amorphous silicon solar cell textures comprising either arrays of voids or particles. Both designs support substantial absorption enhancements (up to 45%) relative to a flat cell with anti-reflection coating, over a large range of cell thicknesses. By leveraging void-based textures 90% of above-bandgap photons are absorbed in cells with maximal vertical dimension of 100 nm.
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“The sharp spectral features seen here exhibit much smaller linewidths than the Mie resonances in individual particle [53] and void resonators [54].”
From Robust inverse design of all-dielectric metasurface transmission-mode color filters (2020) · cites this paper as [54]
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Research works printed but not linked: 27
- Campbell, 1993, J. Opt. Soc. Am. B, 10, 2410, 10.1364/JOSAB.10.002410 · DOI
- Green, 1999, Prog. Photovolt. Res. Appl., 7, 317, 10.1002/(SICI)1099-159X(199907/08)7:4<317::AID-PIP282>3.0.CO;2-3 · DOI
- Müller, 2004, Sol. Energy, 77, 917, 10.1016/j.solener.2004.03.015 · DOI
- Atwater, 2010, Nat. Mater., 9, 205, 10.1038/nmat2629 · DOI
- Ferry, 2010, Opt. Express, 18, A237, 10.1364/OE.18.00A237 · DOI
- Panoiu, 2007, Opt. Lett., 32, 2825, 10.1364/OL.32.002825 · DOI
- Akimov, 2010, Appl. Phys. Lett., 96, 073111, 10.1063/1.3315942 · DOI
- Grandidier, 2011, Adv. Mater. (Deerfield Beach Fla.), 23, 1272, 10.1002/adma.201004393 · DOI
- Kroll, 2008, Phys. Status Solidi, 205, 2777, 10.1002/pssa.200880453 · DOI
- Cao, 2010, Nano Lett., 10, 439, 10.1021/nl9036627 · DOI
- Bandiera, 2008, Appl. Phys. Lett., 93, 193103, 10.1063/1.3021480 · DOI
- Falcone, 2004, Phys. Rev. Lett., 93, 197401, 10.1103/PhysRevLett.93.197401 · DOI
- Du, 2011, Opt. Lett., 36, 1713, 10.1364/OL.36.001713 · DOI
- Yu, 2010, Proc. Natl. Acad. Sci. U.S.A., 107, 17491, 10.1073/pnas.1008296107 · DOI
- Teperik, 2008, Nat. Photonics, 2, 299, 10.1038/nphoton.2008.76 · DOI
- Lal, 2011, Opt. Express, 19, 11256, 10.1364/OE.19.011256 · DOI
- Gaylord, 1986, Appl. Opt., 25, 4562, 10.1364/AO.25.004562 · DOI
- Motamedi, 1992, Appl. Opt., 31, 4371, 10.1364/AO.31.004371 · DOI
- Gombert, 1998, Sol. Energy Mater. Sol. Cells, 54, 333, 10.1016/S0927-0248(98)00084-1 · DOI
- García-Etxarri, 2011, Opt. Express, 19, 4815, 10.1364/OE.19.004815 · DOI
- Gómez-Medina, 2011, J. Nanophotonics, 5, 053512, 10.1117/1.3603941 · DOI
- Schuller, 2009, Opt. Express, 17, 24084, 10.1364/OE.17.024084 · DOI
- Catchpole, 2008, Appl. Phys. Lett., 93, 191113, 10.1063/1.3021072 · DOI
- Evlyukhin, 2010, Phys. Rev. Lett. B, 82, 045404, 10.1103/PhysRevB.82.045404 · DOI
- Moharam, 1995, J. Opt. Soc. Am. A, 12, 1068, 10.1364/JOSAA.12.001068 · DOI
- Leng, 1998, Thin Solid Films, 313–314, 132, 10.1016/S0040-6090(97)00799-2 · DOI
- Shainline, 2009, Opt. Express, 17, 23323, 10.1364/OE.17.023323 · DOI
Cited by
Sorted by citations
Robust inverse design of all-dielectric metasurface transmission-mode color filters
Panda, S. S., Vyas, H. S., & Hegde, R. S. (2020) · Optical Materials Express · doi:10.1364/ome.409186 · Cited by 35
Metadata
- Authors
- Mann, S. A., Grote, R. R., Osgood, R. M., & Schuller, J. A.
- Affiliations
- Columbia University (US)
- Venue
- Optics Express
- Publisher
- Optica Publishing Group
- Published
- 2011-12-01
- Volume
- 19
- Issue
- 25
- Pages
- 25729
- ISSN
- 1094-4087 (ISSN-L)
- OpenAlex
- W2061511463
- Cited by
- 62
- References
- 0
- Citations by year
- 2026: 2 · 2025: 4 · 2024: 1 · 2023: 1 · 2021: 1 · 2020: 3 · 2019: 2 · 2018: 4 · 2017: 3 · 2016: 13 · 2015: 8 · 2014: 9 · 2013: 9 · 2012: 2
- FWCI
- 4.48
- Type
- journal article
- Language
- en
- Open access
- gold
- doi.org
- Locations
- Optics Express (publishedVersion)
- PubMed (publishedVersion)
- Funders
- U.S. Department of Energy (DESC0001085)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Thin-Film Transistor Technologies
- Physical Sciences › Materials Science › Surfaces, Coatings and Films › Optical Coatings and Gratings
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Silicon and Solar Cell Technologies
- Keywords
- thin-film solar cells, light trapping, absorption enhancement, Mie theory, rigorous coupled-wave analysis, polarization anisotropy, forward scattering, amorphous silicon, refractive index contrast, antireflection coatings
- MeSH terms
- Equipment Design, Electric Power Supplies, Refractometry, Solar Energy, Transducers, Computer-Aided Design, Equipment Failure Analysis, Nanoparticles, Optical Devices
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