The DOI matches its Crossref record.
High resolution optical frequency domain reflectometry for characterization of components and assemblies
Open accessAbstract
We describe a technique for polarization sensitive optical frequency domain reflectometry (OFDR) that achieves 22 micrometer two-point spatial resolution over 35 meters of optical length with -97 dB sensitivity in a single measurement taking only seconds. We demonstrate OFDR's versatility in both time- and frequency-domain metrology by analyzing a fiber Bragg grating (FBG) in both the spectral and impulse response domains. We also demonstrate how a polarization diversity receiver can be used in an OFDR system to track changes in the polarization state of light propagating through a birefringent component.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Optical fiber sensing for marine environment and marine structural health monitoring: A review
Min, R., Liu, Z., Pereira, L., Yang, C., Sui, Q., & Marques, C. (2021) · Optics & Laser Technology · doi:10.1016/j.optlastec.2021.107082 · Cited by 475
Blanco-Redondo, A., de Sterke, C. M., Sipe, J. E., Krauss, T. F., Eggleton, B. J., & Husko, C. (2016) · Nature Communications · doi:10.1038/ncomms10427 · Cited by 285
Ultra-low-loss Ta_2O_5-core/SiO_2-clad planar waveguides on Si substrates
Belt, M., Davenport, M. L., Bowers, J. E., & Blumenthal, D. J. (2017) · Optica · doi:10.1364/optica.4.000532 · Cited by 130
Ultra-Low-Loss Silicon Waveguides for Heterogeneously Integrated Silicon/III-V Photonics
Tran, M. A., Huang, D., Komljenovic, T., Peters, J., Malik, A., & Bowers, J. E. (2018) · Applied Sciences · doi:10.3390/app8071139 · Cited by 128
Embedded metallized optical fibers for high temperature applications*
Petrie, C. M., Sridharan, N., Subramanian, M., Hehr, A., Norfolk, M., & Sheridan, J. (2019) · Smart Materials and Structures · doi:10.1088/1361-665x/ab0b4e · Cited by 62
Metadata
- Authors
- Soller, B. J., Gifford, D. K., Wolfe, M. S., & Froggatt, M. E.
- Venue
- Optics Express
- Publisher
- Optica Publishing Group
- Published
- 2005
- Volume
- 13
- Issue
- 2
- Pages
- 666
- ISSN
- 1094-4087 (ISSN-L)
- OpenAlex
- W2085009766
- Cited by
- 755
- References
- 0
- FWCI
- 12.08
- Type
- journal article
- Language
- en
- Open access
- gold
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: High resolution optical frequency domain reflectometry for characterization of components and assemblies. https://app.cochat.ai/papers/10.1364/opex.13.000666
- The paper
- Soller, B. J., Gifford, D. K., Wolfe, M. S., & Froggatt, M. E. (2005). High resolution optical frequency domain reflectometry for characterization of components and assemblies. Optics Express. https://doi.org/10.1364/opex.13.000666
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
