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Temperature Analysis of Parallel-Connected IGBTs under PWM Operating Conditions Using a Physics Model

Horiguchi, Takeshi, Tsukamoto, Kohei, Tominaga, Shinji, Nishimura, Tadashi, Fujita, Hideaki, Akagi, Hirofumi, Kinouchi, Shin-ichi, Oi, Takeshi, Koyama, Masato·2014·IEEJ Transactions on Industry Applications
DOI 10.1541/ieejias.134.486
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Cited by 2

Research works printed but not linked: 19

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  13. (13) P. M. Igic, P. A. Mawby, M. S. Towers, W. Jamal, and S. Batcup: “Investigation of the Power Dissipation During IGBT Turn-Off Using a new Physics-Based IGBT Compact Model”, Microelectronics Reliability, Vol. 42, pp. 1045-1052 (2002)
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  17. (17) S. Tominaga, T. Jimichi, H. Urushibata, H. Fujita, H. Akagi, S. Kinouchi, and T. Oi: “Modeling of Power MOSFETs With Focus on Voltage Dependency of Terminal Capacitances”, 2009 National Convention Record, IEEJ, Vol. 4, pp. 242-243 (2009-3) (in Japanese)
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  19. (19) A. T. Bryant, L. Lu, E. Santi, P. R. Palmer, and J. L. Hudgins: “Two Step Parameter Extraction Procedure With Formal Optimazation for Physics-Based Circuit Simulator IGBT and p-i-n Diode Models”, IEEE Trans. Power Electron., Vol. 21, No. 6, pp. 295-309 (2006-3) · DOI

Metadata

Authors
Horiguchi, T., Tsukamoto, K., Tominaga, S., Nishimura, T., Fujita, H., Akagi, H., Kinouchi, S.-I., Oi, T., & Koyama, M.
Venue
IEEJ Transactions on Industry Applications
Publisher
Institute of Electrical Engineers of Japan (IEE Japan)
Published
2014
Volume
134
Issue
5
Pages
486-495
ISSN
  • 0913-6339
  • 1348-8163
DOI
10.1541/ieejias.134.486
Cited by
2
Language
en

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CoChat. (2026). Citation check: Temperature Analysis of Parallel-Connected IGBTs under PWM Operating Conditions Using a Physics Model. https://app.cochat.ai/papers/10.1541/ieejias.134.486
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Horiguchi, T., Tsukamoto, K., Tominaga, S., Nishimura, T., Fujita, H., Akagi, H., Kinouchi, S.-I., Oi, T., & Koyama, M. (2014). Temperature Analysis of Parallel-Connected IGBTs under PWM Operating Conditions Using a Physics Model. IEEJ Transactions on Industry Applications. https://doi.org/10.1541/ieejias.134.486

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