The DOI matches its Crossref record; 101 of the 101 references it cites were found in a registry or an index.
Deep materials informatics: Applications of deep learning in materials science
Open accessAbstract
The growing application of data-driven analytics in materials science has led to the rise of materials informatics. Within the arena of data analytics, deep learning has emerged as a game-changing technique in the last few years, enabling numerous real-world applications, such as self-driving cars. In this paper, the authors present an overview of deep learning, its advantages, challenges, and recent applications on different types of materials data. The increasingly availability of materials databases and big data in general, along with groundbreaking advances in deep learning offers a lot of promise to accelerate the discovery, design, and deployment of next-generation materials.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Deep Residual Learning for Image Recognition
He, K., Zhang, X., Ren, S., & Sun, J. (2016) · 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2016.90 · Cited by 235,474
Very Deep Convolutional Networks for Large-Scale Image Recognition
Simonyan, K., & Zisserman, A. (2014) · arXiv · doi:10.48550/arxiv.1409.1556 · Cited by 114,148
ImageNet classification with deep convolutional neural networks
Krizhevsky, A., Sutskever, I., & Hinton, G. E. (2017) · Communications of the ACM · doi:10.1145/3065386 · Cited by 112,155
LeCun, Y., Bengio, Y., & Hinton, G. (2015) · Nature · doi:10.1038/nature14539 · Cited by 84,126
ImageNet: A large-scale hierarchical image database
Deng, J., Dong, W., Socher, R., Li, L.-J., Li, K., & Fei-Fei, L. (2009) · 2009 IEEE Conference on Computer Vision and Pattern Recognition · doi:10.1109/cvpr.2009.5206848 · Cited by 65,333
(2014) · Cited by 33,419
(2008) · Journal of Machine Learning Research · Cited by 33,051
Learning representations by back-propagating errors
Rumelhart, D. E., Hinton, G. E., & Williams, R. J. (1986) · Nature · doi:10.1038/323533a0 · Cited by 31,892
Semi-supervised classification with graph convolutional networks
Kipf, T. N., & Welling, M. (2016) · arXiv · doi:10.48550/arxiv.1609.02907 · Cited by 24,853
GAN(Generative Adversarial Nets)
(2017) · Journal of Japan Society for Fuzzy Theory and Intelligent Informatics · doi:10.3156/jsoft.29.5_177_2 · Cited by 19,270
Cited by
Recent advances and applications of deep learning methods in materials science
Choudhary, K., DeCost, B., Chen, C., Jain, A., Tavazza, F., Cohn, R., Park, C. W., Choudhary, A., Agrawal, A., Billinge, S. J. L., et al. (2022) · npj Computational Materials · doi:10.1038/s41524-022-00734-6 · Cited by 1,172
“Such an outburst of data requires automated analysis which can be facilitated by machine learning (ML) techniques 13 – 20 .”
MethodSelf-citationEmerging materials intelligence ecosystems propelled by machine learning
Batra, R., Song, L., & Ramprasad, R. (2020) · Nature Reviews Materials · doi:10.1038/s41578-020-00255-y · Cited by 446
Jha, D., Choudhary, K., Tavazza, F., Liao, W.-K., Choudhary, A., Campbell, C., & Agrawal, A. (2019) · Nature Communications · doi:10.1038/s41467-019-13297-w · Cited by 339
Self-citationGraph convolutional neural networks with global attention for improved materials property prediction
Louis, S.-Y., Zhao, Y., Nasiri, A., Wang, X., Song, Y., Liu, F., & Hu, J. (2020) · Physical Chemistry Chemical Physics · doi:10.1039/d0cp01474e · Cited by 257
Metadata
- Authors
- Agrawal, A., & Choudhary, A.
- Venue
- MRS Communications
- Published
- 2019-09
- Volume
- 9
- Issue
- 3
- Pages
- 779-792
- ISSN
- 2159-6859 (ISSN-L)
- 2159-6867
- OpenAlex
- W2953053221
- Cited by
- 294
- References
- 101
- FWCI
- 8.08
- Type
- journal article
- Language
- en
- Open access
- hybrid
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Deep materials informatics: Applications of deep learning in materials science. https://app.cochat.ai/papers/10.1557/mrc.2019.73
- The paper
- Agrawal, A., & Choudhary, A. (2019). Deep materials informatics: Applications of deep learning in materials science. MRS Communications. https://doi.org/10.1557/mrc.2019.73
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.