Evidential Deep Learning to Quantify Classification Uncertainty
Open accessAbstract
Deterministic neural nets have been shown to learn effective predictors on a wide range of machine learning problems. However, as the standard approach is to train the network to minimize a prediction loss, the resultant model remains ignorant to its prediction confidence. Orthogonally to Bayesian neural nets that indirectly infer prediction uncertainty through weight uncertainties, we propose explicit modeling of the same using the theory of subjective logic. By placing a Dirichlet distribution on the class probabilities, we treat predictions of a neural net as subjective opinions and learn the function that collects the evidence leading to these opinions by a deterministic neural net from data. The resultant predictor for a multi-class classification problem is another Dirichlet distribution whose parameters are set by the continuous output of a neural net. We provide a preliminary analysis on how the peculiarities of our new loss function drive improved uncertainty estimation. We observe that our method achieves unprecedented success on detection of out-of-distribution queries and endurance against adversarial perturbations.
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Vanilla EDL is considered a state-of-the-art approach for efficient single-pass uncertainty estimation.
“It is considered a state-of-the-art (SOTA) approach for efficient single-pass uncertainty estimation.”
From A cascade framework for on-device uncertainty-aware event detection on microcontrollers (2026) · cites this paper as [24]
The Conclusions (p. 9) say EDL significantly improves the state of the art on two uncertainty benchmarks, and Related Work (p. 9) describes obtaining its Dirichlet parameters from a deterministic neural net rather than Monte Carlo integration. This supports the characterization of EDL as a strong uncertainty-estimation method, but the paper does not explicitly establish single-pass operation or measure its efficiency; its state-of-the-art claim is limited to those two benchmarks. (LLM, conf=0.84)
Experimental — accuracy not yet measuredEvidential Deep Learning allows a model to directly output a probability distribution parameterized by evidence rather than just a point prediction, enabling efficient uncertainty quantification within a single forward pass.
“EDL allows the model to directly output a probability distribution (parameterized by evidence) rather than just a point prediction, enabling efficient uncertainty quantification within a single forward pass (Section 4).”
From A cascade framework for on-device uncertainty-aware event detection on microcontrollers (2026) · cites this paper as [24]
The Type II Maximum Likelihood loss encourages the model to produce high evidence corresponding to the correct class label.
“This loss encourages the model to produce high evidence ( 𝛼 𝑖 𝑐 or 𝛽 𝑖 𝑐 ) corresponding to the correct class label.”
From A cascade framework for on-device uncertainty-aware event detection on microcontrollers (2026) · cites this paper as [24]
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“Some first proposals for dealing with this case can already be found in the literature (DeVries and Taylor, 2018; Lee et al., 2018b; Malinin and Gales, 2018; Sensoy et al., 2018).”
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A cascade framework for on-device uncertainty-aware event detection on microcontrollers
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QUTE: Quantifying Uncertainty in TinyML with Early-exit-assisted ensembles for model-monitoring
Ghanathe, N. P., & Wilton, S. J. E. (2024) · arXiv · doi:10.48550/arxiv.2404.12599
- Authors
- Sensoy, M., Kaplan, L., & Kandemir, M.
- Affiliations
- University of Southern Denmark (DK)
- Venue
- arXiv
- Publisher
- arXiv
- Published
- 2018
- arXiv
- 1806.01768
- OpenAlex
- W2806471870
- Cited by
- 694
- References
- 1
- Citations by year
- 2026: 11 · 2025: 122 · 2024: 173 · 2023: 154 · 2022: 78 · 2021: 77 · 2020: 54 · 2019: 24 · 2018: 1
- FWCI
- 15.52
- Type
- conference paper
- Language
- en
- Open access
- green
- arxiv.org
- Locations
- University of Southern Denmark Research Portal (University of Southern Denmark) (publishedVersion)
- arXiv (Cornell University) (submittedVersion)
- eResearch@Ozyegin (submittedVersion, other-oa)
- arXiv (Cornell University)
- Topics
- Physical Sciences › Computer Science › Artificial Intelligence › Adversarial Robustness in Machine Learning
- Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Advanced Neural Network Applications
- Physical Sciences › Computer Science › Artificial Intelligence › Gaussian Processes and Bayesian Inference
- Keywords
- evidential deep learning, classification uncertainty, subjective logic, Dirichlet distribution, multi-class classification, out-of-distribution detection, adversarial robustness, loss function design, prediction confidence
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