Antiferroelectric Oxide Thin-Films: Fundamentals, Properties, and Applications
Open accessAbstract
Antiferroelectrics have received blooming interests because of a wide range of potential applications in energy storage, solid-state cooling, thermal switch, transducer, actuation, and memory devices. Many of those applications are the most prospective in thin film form. The antiferroelectric ordering in thin films is highly sensitive to a rich set of factors, such as lattice strain, film thickness, surface and interface effects as well as film stoichiometry. To unlock the full potential of these materials and design high-quality thin films for functional devices, a comprehensive and systematic understanding of their behavior is essential. In conjunction with the necessary fundamental background of antiferroelectrics, we review recent progress on various antiferroelectric oxide thin films, the key parameters that trigger their phase transition and the device applications that rely on the robust responses to electric, thermal, and optical stimuli. Current challenges and future perspectives highlight new and emerging research directions in this field. It is hoped that this review can boost the development of antiferroelectric thin-film materials and device design, stimulating more researchers to explore the unknowns together.
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Cited by 3
- Authors
- Si, Y., Zhang, T., Liu, C., Das, S., Xu, B., Burkovsky, R. G., Wei, X.-K., & Chen, Z.
- Affiliations
- Harbin Institute of Technology (CN)
- Nanjing Normal University (CN)
- Indian Institute of Science Bangalore (IN)
- Soochow University (CN)
- Xiamen University (CN)
- Venue
- arXiv
- Publisher
- arXiv
- Published
- 2023
- ISSN
- 2331-8422 (ISSN-L)
- arXiv
- 2312.16806
- OpenAlex
- W4390478888
- Cited by
- 3
- References
- 0
- Citations by year
- 2025: 2 · 2024: 1
- Type
- posted content
- Language
- en
- Open access
- green
- arxiv.org
- Licence
- Locations
- arXiv (Cornell University) (submittedVersion, cc-by-nc-nd)
- arXiv (Cornell University)
- Funders
- Indian Institute of Science
- National Natural Science Foundation of China (52206092, 52372105)
- Government of Jiangsu Province (JSSCBS20210315)
- Natural Science Foundation of Jiangsu Province (BK20210565)
- Xiamen University
- Science and Engineering Research Board (SRG/2022/000058)
- Fundamental Research Funds for the Central Universities (HIT.OCEF.2022038)
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Ferroelectric and Piezoelectric Materials
- Physical Sciences › Materials Science › Electronic, Optical and Magnetic Materials › Multiferroics and related materials
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Ferroelectric and Negative Capacitance Devices
- Keywords
- thin films, antiferroelectric phase transition, lattice strain, film thickness effects, surface and interface effects, stoichiometry, energy storage, solid-state cooling, thermal switch, transducers, actuators, memory devices
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