Back to Point: Exploring Point-Language Models for Zero-Shot 3D Anomaly Detection
Open accessAbstract
Zero-shot (ZS) 3D anomaly detection is crucial for reliable industrial inspection, as it enables detecting and localizing defects without requiring any target-category training data. Existing approaches render 3D point clouds into 2D images and leverage pre-trained Vision-Language Models (VLMs) for anomaly detection. However, such strategies inevitably discard geometric details and exhibit limited sensitivity to local anomalies. In this paper, we revisit intrinsic 3D representations and explore the potential of pre-trained Point-Language Models (PLMs) for ZS 3D anomaly detection. We propose BTP (Back To Point), a novel framework that effectively aligns 3D point cloud and textual embeddings. Specifically, BTP aligns multi-granularity patch features with textual representations for localized anomaly detection, while incorporating geometric descriptors to enhance sensitivity to structural anomalies. Furthermore, we introduce a joint representation learning strategy that leverages auxiliary point cloud data to improve robustness and enrich anomaly semantics. Extensive experiments on Real3D-AD and Anomaly-ShapeNet demonstrate that BTP achieves superior performance in ZS 3D anomaly detection. Code will be available at \href{https://github.com/wistful-8029/BTP-3DAD}{https://github.com/wistful-8029/BTP-3DAD}.
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- Authors
- Li, K., Li, G., Zhou, M., Li, M., Han, D., & Wan, J.
- Affiliations
- Qilu University of Technology (CN)
- Venue
- arXiv
- Publisher
- arXiv
- Published
- 2026
- ISSN
- 2331-8422 (ISSN-L)
- arXiv
- 2603.21511
- OpenAlex
- W7140161513
- Cited by
- 0
- References
- 0
- Type
- posted content
- Language
- en
- Open access
- green
- arxiv.org
- Locations
- arXiv (Cornell University) (submittedVersion)
- arXiv (Cornell University)
- Funders
- National Natural Science Foundation of China (62401305)
- Topics
- Physical Sciences › Engineering › Computational Mechanics › 3D Shape Modeling and Analysis
- Physical Sciences › Computer Science › Artificial Intelligence › Anomaly Detection Techniques and Applications
- Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
- Keywords
- point clouds, vision-language models, anomaly localization, joint representation learning, industrial inspection
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