Corrections of the NIST Statistical Test Suite for Randomness
Open accessAbstract
It is well known that the NIST statistical test suite was used for the evaluation of AES candidate algorithms. We have found that the test setting of Discrete Fourier Transform test and Lempel-Ziv test of this test suite are wrong. We give four corrections of mistakes in the test settings. This suggests that re-evaluation of the test results should be needed.
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The NIST reference distribution for N1 is normal with μ = 0.95·n/2 and σ2 = 0.95·0.05·n/4, as experimentally found by many authors.
“The reference distribution for N 1 indicated by NIST in [2] is a normal distribution with µ = N 0 = 0 . 95 · n/ 2 and σ 2 = 0 . 95 · 0 . 05 · n/ 4 . This has been experimentally found independently by many authors [14], [15].”
From On Statistical Tests for Randomness Included in the NIST SP800-22 Test Suite and Based on the Binomial Distribution (2012) · cites this paper as [14]
Section 3.2 (p. 10) says NIST's theoretical distribution uses mean 0.95·n/2 but variance 0.95·0.05·n/2. The paper argues that dependence between peaks requires the corrected variance 0.95·0.05·n/4; it does not identify that corrected variance as NIST's reference value. (LLM, conf=0.90)
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Experimental — accuracy not yet measuredFor the Spectral Test, the paper proposed a refinement of the reference distribution for p-value computation, and with this refinement the known issues of these tests are strongly reduced.
“Furthermore, for the Spectral Test, we have proposed a refinement of the reference distribution for the p -value computation. With this refinement, the issues of these tests that are known and addressed in many other papers [14], [15] are strongly reduced.”
From On Statistical Tests for Randomness Included in the NIST SP800-22 Test Suite and Based on the Binomial Distribution (2012) · cites this paper as [14]
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References 7 · Cited by 54
Research works printed but not linked: 6
- [4]4. Menezes et al.: Handbook of Applied Cryptography, CRC Press (1997)
- [9]9. S. Murphy: The power of NIST's Statistical Testing of AES Candidates, The Third AES Candidate Conference (2000). http://csrc.nist.gov/aes/
- [10]10. S. Wolfram: Random sequence generation by cellular automata, Advances in Applied Mathematics Vol. 7 (1986) 123-169
- [11]11. S. Wolfram: Cryptography with cellular automata, Lecture Notes in Computer Science Vol. 0218 (CRYPTO'85) 429-432
- [14]14. D. Aldous et al.: A diffusion limit for a class of randomly-growing binary trees, Probab. Th. Rel. Fields Vol. 79 (1988) 509-542
- [15]15. P. Kirschenhofer et al.: Digital search trees again revised: the internal path length perspective, SIAM J. Comput. Vol. 23 (1994) 598-616
- Authors
- Kim, S.-J., Umeno, K., & Hasegawa, A.
- Venue
- arXiv
- Publisher
- arXiv
- Published
- 2004
- ISSN
- 2331-8422 (ISSN-L)
- arXiv
- nlin/0401040
- OpenAlex
- W1619204927
- Cited by
- 54
- References
- 7
- Citations by year
- 2025: 3 · 2024: 1 · 2023: 4 · 2022: 4 · 2021: 4 · 2020: 6 · 2019: 1 · 2018: 3 · 2017: 2 · 2016: 4 · 2015: 5 · 2014: 5 · 2013: 1 · 2012: 1
- Type
- journal article
- Language
- en
- Open access
- green
- arxiv.org
- Locations
- arXiv (Cornell University) (submittedVersion)
- arXiv (Cornell University)
- Topics
- Physical Sciences › Computer Science › Artificial Intelligence › Cryptographic Implementations and Security
- Physical Sciences › Computer Science › Artificial Intelligence › Coding theory and cryptography
- Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Chaos-based Image/Signal Encryption
- Keywords
- NIST test suite, randomness testing
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