Mawby, Philip

Condition Monitoring for Device Reliability in Power Electronic Converters: A Review

Yang, S., Xiang, D., Bryant, A., Mawby, P., Ran, L., & Tavner, P. (2010) · IEEE Transactions on Power Electronics

Silicon Carbide Semiconductor TechnologiesReliability and Maintenance Optimization

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Investigating the reliability of SiC MOSFET body diodes using Fourier series modelling

Bonyadi, R., Alatise, O., Jahdi, S., Hu, J., Evans, L., & Mawby, P. A. (2014) · 2014 IEEE Energy Conversion Congress and Exposition (ECCE)

Silicon Carbide Semiconductor TechnologiesElectromagnetic Compatibility and Noise Suppression

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