Cited by 1,278Silicon Carbide Semiconductor TechnologiesReliability and Maintenance OptimizationMultilevel Inverters and Converters

Condition Monitoring for Device Reliability in Power Electronic Converters: A Review

Open access
Yang, Shaoyong, Xiang, Dawei, Bryant, Angus, Mawby, Philip, Ran, Li, Tavner, Peter·2010·IEEE Transactions on Power Electronics

Abstract

Condition monitoring (CM) has already been proven to be a cost effective means of enhancing reliability and improving customer service in power equipment, such as transformers and rotating electrical machinery. CM for power semiconductor devices in power electronic converters is at a more embryonic stage; however, as progress is made in understanding semiconductor device failure modes, appropriate sensor technologies, and signal processing techniques, this situation will rapidly improve. This technical review is carried out with the aim of describing the current state of the art in CM research for power electronics. Reliability models for power electronics, including dominant failure mechanisms of devices are described first. This is followed by a description of recently proposed CM techniques. The benefits and limitations of these techniques are then discussed. It is intended that this review will provide the basis for future developments in power electronics CM.

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Crossref · 10.1109/tpel.2010.2049377

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Authors
Yang, S., Xiang, D., Bryant, A., Mawby, P., Ran, L., & Tavner, P.
Affiliations
  • University of Warwick (GB)
  • Durham University (GB)
Venue
IEEE Transactions on Power Electronics
Published
2010-11
Volume
25
Issue
11
Pages
2734-2752
ISSN
  • 0885-8993 (ISSN-L)
  • 1941-0107
OpenAlex
W2167320299
Cited by
1,278
References
135
Citations by year
2026: 65 · 2025: 104 · 2024: 105 · 2023: 137 · 2022: 93 · 2021: 104 · 2020: 93 · 2019: 109 · 2018: 94 · 2017: 79 · 2016: 80 · 2015: 63 · 2014: 60 · 2013: 49 · 2012: 22
FWCI
22.95
Type
journal article
Language
en
Locations
  • IEEE Transactions on Power Electronics (publishedVersion)
  • Durham Research Online (Durham University) (acceptedVersion)
  • Durham Research Online (Durham University) (submittedVersion, cc-by)
Funders
Engineering and Physical Sciences Research Council (EP/E02744X/1, EP/E026923/1)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Silicon Carbide Semiconductor Technologies
  • Physical Sciences › Engineering › Safety, Risk, Reliability and Quality › Reliability and Maintenance Optimization
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Multilevel Inverters and Converters
Keywords
condition monitoring, power semiconductor devices, power converters, device reliability, failure mechanisms, reliability modeling, sensor technology, signal processing, power electronics reliability

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