Neely, Jason C.
Sandia National Laboratories
2 papers on CoChatORCID 0000-0002-8757-3228
Most cited papers
- Verified
A Review of GaN HEMT Dynamic On-Resistance and Dynamic Stress Effects on Field Distribution
Gill, L., DasGupta, S., Neely, J. C., Kaplar, R. J., & Michaels, A. J. (2024) · IEEE Transactions on Power Electronics
GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies
Cited by 68
- Verified
DC link bus design for high frequency, high temperature converters
Stewart, J., Neely, J., Delhotal, J., & Flicker, J. (2017) · 2017 IEEE Applied Power Electronics Conference and Exposition (APEC)
Silicon Carbide Semiconductor TechnologiesAdvanced DC-DC Converters
Cited by 25
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