Medjdoub, Farid
Institut d'Electronique, de Microélectronique et de Nanotechnologie
3 papers on CoChatORCID 0000-0002-4753-4718
Most cited papers
- Verified
GaN-based power devices: Physics, reliability, and perspectives
Meneghini, M., De Santi, C., Abid, I., Buffolo, M., Cioni, M., Khadar, R. A., Nela, L., Zagni, N., Chini, A., Medjdoub, F., et al. (2021) · Journal of Applied Physics
GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies
Cited by 723
- Verified
InAlGaN/GaN HEMTs at Cryogenic Temperatures
Dogmus, E., Kabouche, R., Lepilliet, S., Linge, A., Zegaoui, M., Ben-Ammar, H., Chauvat, M.-P., Ruterana, P., Gamarra, P., Lacam, C., et al. (2016) · Electronics
GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies
Cited by 37
- Verified
GaN-on-silicon transistors with reduced current collapse and improved blocking voltage by means of local substrate removal
Abid, I., Canato, E., Meneghini, M., Meneghesso, G., Cheng, K., & Medjdoub, F. (2021) · Applied Physics Express
GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies
Cited by 13
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