Fabris, Elena

University of Padua

1 paper on CoChatORCID 0000-0003-1345-5111

Most cited papers

Verified
Hot-Electron Trapping and Hole-Induced Detrapping in GaN-Based GITs and HD-GITs
Fabris, E., Meneghini, M., De Santi, C., Borga, M., Kinoshita, Y., Tanaka, K., Ishida, H., Ueda, T., Meneghesso, G., & Zanoni, E. (2019) · IEEE Transactions on Electron Devices
GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies
Cited by 29

Go further with a free account

Verify every reference, keep papers in a library, and ask questions across them.

Sign up - it is free