Shieh, Jiann-Shing

Yuan Ze University

1 paper on CoChatORCID 0000-0002-6407-5090

Most cited papers

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Defect detection in printed circuit boards using you-only-look-once convolutional neural networks
Adibhatla, V. A., Chih, H.-C., Hsu, C.-C., Cheng, J., Abbod, M. F., & Shieh, J.-S. (2020) · Electronics
Industrial Vision Systems and Defect DetectionAdvanced Neural Network Applications
Cited by 179

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