Plawsky, Joel L.

Rensselaer Polytechnic Institute

1 paper on CoChatORCID 0000-0003-3911-2459

Most cited papers

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Image scanning ellipsometry for measuring nonuniform film thickness profiles
Liu, A.-H., Wayner, P. C., & Plawsky, J. L. (1994) · Applied Optics
Optical Polarization and EllipsometryOptical measurement and interference techniques
Cited by 46

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