Rampazzo, Fabiana

Reliability of GaN High-Electron-Mobility Transistors: State of the Art and Perspectives

Meneghesso, G., Verzellesi, G., Danesin, F., Rampazzo, F., Zanon, F., Tazzoli, A., Meneghini, M., & Zanoni, E. (2008) · IEEE Transactions on Device and Materials Reliability

GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies

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Reliability and failure analysis in power GaN-HEMTs: An overview

Meneghini, M., Rossetto, I., De Santi, C., Rampazzo, F., Tajalli, A., Barbato, A., Ruzzarin, M., Borga, M., Canato, E., Zanoni, E., et al. (2017) · 2017 IEEE International Reliability Physics Symposium (IRPS)

GaN-based semiconductor devices and materialsSilicon Carbide Semiconductor Technologies

Cited by 120