Seok, Jun Yeong
Seoul National University
2 papers on CoChat
Most cited papers
- Verified
Highly Uniform, Electroforming‐Free, and Self‐Rectifying Resistive Memory in the Pt/Ta2O5/HfO2‐x/TiN Structure
Yoon, J. H., Song, S. J., Yoo, I., Seok, J. Y., Yoon, K. J., Kwon, D. E., Park, T. H., & Hwang, C. S. (2014) · Advanced Functional Materials
Advanced Memory and Neural ComputingFerroelectric and Negative Capacitance Devices
Cited by 277
- Verified · note
Pt/Ta2O5/HfO2−x/Ti Resistive Switching Memory Competing with Multilevel NAND Flash
Yoon, J. H., Kim, K. M., Song, S. J., Seok, J. Y., Yoon, K. J., Kwon, D. E., Park, T. H., Kwon, Y. J., Shao, X., & Hwang, C. S. (2015) · Advanced Materials
Advanced Memory and Neural ComputingFerroelectric and Negative Capacitance Devices
Cited by 175
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