Plotkin-Swing, B

Nion (United States)

1 paper on CoChatORCID 0000-0001-8920-2968

Most cited papers

Verified
Ultra-high Resolution EELS Analysis and STEM Imaging at 20 keV
Dellby, N., Nelson-Quillin, A. M., Krivanek, O. L., Hrncirik, P., Mittelberger, A., Plotkin-Swing, B., & Lovejoy, T. C. (2023) · Microscopy and Microanalysis
Advanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy Techniques
Cited by 9

Go further with a free account

Verify every reference, keep papers in a library, and ask questions across them.

Sign up - it is free