Aichinger, Thomas

Infineon Technologies (Austria)

2 papers on CoChatORCID 0000-0002-6866-8141

Most cited papers

Verified
Threshold voltage peculiarities and bias temperature instabilities of SiC MOSFETs
Aichinger, T., Rescher, G., & Pobegen, G. (2018) · Microelectronics Reliability
Silicon Carbide Semiconductor TechnologiesSemiconductor materials and devices
Cited by 278
Verified
Understanding BTI in SiC MOSFETs and Its Impact on Circuit Operation
Puschkarsky, K., Reisinger, H., Aichinger, T., Gustin, W., & Grasser, T. (2018) · IEEE Transactions on Device and Materials Reliability
Silicon Carbide Semiconductor TechnologiesSemiconductor materials and devices
Cited by 115

Go further with a free account

Verify every reference, keep papers in a library, and ask questions across them.

Sign up - it is free