Constantoudis, Vassilios

Need for LWR metrology standardization: the imec roughness protocol

Lorusso, G. F., Sutani, T., Rutigliani, V., van Roey, F., Moussa, A., Charley, A.-L., Mack, C., Naulleau, P., Perera, C., Constantoudis, V., et al. (2018) · Journal of Micro/Nanopatterning, Materials, and Metrology

Advancements in Photolithography TechniquesSurface Roughness and Optical Measurements

Cited by 59

Large work function shift of organic semiconductors inducing enhanced interfacial electron transfer in organic optoelectronics enabled by porphyrin aggregated nanostructures

Vasilopoulou, M., Douvas, A. M., Georgiadou, D. G., Constantoudis, V., Davazoglou, D., Kennou, S., Palilis, L. C., Daphnomili, D., Coutsolelos, A. G., & Argitis, P. (2014) · Nano Research

Organic Electronics and PhotovoltaicsOrganic Light-Emitting Diodes Research

Cited by 49