Grasser, Tibor

TU Wien

1 paper on CoChatORCID 0000-0001-6536-2238

Most cited papers

Verified
Understanding BTI in SiC MOSFETs and Its Impact on Circuit Operation
Puschkarsky, K., Reisinger, H., Aichinger, T., Gustin, W., & Grasser, T. (2018) · IEEE Transactions on Device and Materials Reliability
Silicon Carbide Semiconductor TechnologiesSemiconductor materials and devices
Cited by 115

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